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Thomas Roth

Thomas Roth appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record
physics.opticsphysics.app-phphysics.ins-detphysics.acc-ph

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Published work

7 published item(s)

preprint2022arXiv

Tilting refractive x-ray lenses for fine-tuning their focal length

In this work, we measure and model tilted x-ray refractive lenses to investigate their effects on an x-ray beam. The modelling is benchmarked against at-wavelength metrology obtained with x-ray speckle vector tracking experiments (XSVT) at the BM05 beamline at the ESRF-EBS light source, showing very good agreement. This validation permits us to explore possible applications of tilted x-ray lenses in optical design: we demonstrate that tilting 1D lenses around their focusing direction can be used for fine-tuning their focal length with possible applications in beamline optical design.

0 citations0 reviewsNo code linkedOpen access
preprint2021arXiv

Polished diamond x-ray lenses

We present high quality bi-concave 2D focusing diamond x-ray lenses of apex-radius $R=100~μ$m produced via laser-ablation and improved via a mechanical polishing process. Both for polished and unpolished individual lenses and for stacks of 10 lenses, we show the remaining figure errors determined using x-ray speckle tracking and compare these results to those of commercial $R=50~μ$m beryllium lenses that have similar focusing strength and physical aperture. For two stacks of 10 diamond lenses (polished and unpolished) and a stack of 11 beryllium lenses, we present measured 2D beam profiles out of focus and wire scans to obtain the beam size in the focal plane. These results are complemented with small angle x-ray scattering (SAXS) measurements of a polished and an unpolished diamond lens. Again, we compare this to the SAXS of a beryllium lens. The polished x-ray lenses show similar figure errors to commercially available Be lenses. While the beam size in the focal plane is comparable with that of the Be lenses, the SAXS signal of the polished diamond lenses is considerably lower.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Recent developments in X-ray lens modelling with SRW

The advent of 4$^\text{th}$ generation high-energy synchrotron facilities (ESRF-EBS and the planned APS-U, PETRA-IV and SPring-8 II) and free-electron lasers (Eu-XFEL and SLAC) allied with the recent demonstration of high-quality free-form refractive optics for beam shaping and optical correction has revived interest in compound refractive lenses (CRLs) as optics for beam transport, probe formation in X-ray micro- and nano-analysis as well as for imaging applications. Ideal CRLs have long been made available in the 'Synchrotron Radiation Workshop' (SRW), however, the current context requires more sophisticated modelling of X-ray lenses. In this work, we revisit the already implemented wave-optics model for an ideal X-ray lens in the projection approximation and propose modifications to it as to allow more degrees of freedom to both the front and back surfaces independently, which enables to reproduce misalignments and manufacturing errors commonly found in X-ray lenses. For the cases where simply tilting and transversely offsetting the parabolic sections of a CRL is not enough, we present the possibility of generating the figure errors by using Zernike and Legendre polynomials or directly adding metrology data to the lenses. We present the effects of each new degree of freedom by calculating their impact on point spread function and the beam caustics.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

X-ray optics and beam characterization using random modulation: Theory

X-ray near-field speckle-based phase-sensing approaches provide efficient means to characterise optical elements. Here, we present a theoretical review of several of these speckle methods in the frame of optical characterisation and provide a generalization of the concept. As we also demonstrate experimentally in another paper, the methods theoretically developed here can be applied with different beams and optics and within a variety of situations where at-wavelength metrology is desired. By understanding the differences between the various processing methods, it is possible to find and implement the best suited approach for each metrology scenario.

0 citations0 reviewsNo code linkedOpen access
preprint2019arXiv

Modelling phase imperfections in compound refractive lenses

Compound refractive lenses (CRL) offer outstanding potential for probe formation in X-ray micro- and nano-analysis as well as for imaging applications, but effective aberration-free focusing of X-rays is a key consideration when high spatial resolution and intensities are required. Available refractive optics have non-negligible aberrations which degrade their final performance. We describe a framework based on physical-optics for simulating the effect of imperfect CRL upon an X-ray beam, taking into account measured phase errors obtained from at-wavelength metrology. We model, with increasing complexity, a CRL stack as a single thin phase element, then as a more realistic compound-element including absorption and thickness effects and finally, we add realistic optical imperfections to the CRL. Coherent and partially-coherent simulations using the "Synchrotron Radiation Workshop" (SRW) are used to evaluate the different models, the effects of the phase errors and to check the validity of the design equations and suitability of the figures of merit.

0 citations0 reviewsNo code linkedOpen access
preprint2019arXiv

X-ray optics and beam characterisation using random modulation: Experiments

In a previous paper, we reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. We here show experimental applications of the technique for characterising both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with minimum amount of wavefront distortion. We also recall how such methods can facilitate online optimization of active optics.

0 citations0 reviewsNo code linkedOpen access
preprint2014arXiv

X-ray diffraction microscopy based on refractive optics

We describe a diffraction microscopy technique based on refractive optics to study structural variations in crystals. The X-ray beam diffracted by a crystal was magnified by beryllium parabolic refractive lenses on a 2D X-ray camera. The microscopy setup was integrated into the 6-circle Huber diffractometer at the ESRF beamline ID06. Our setup allowed us to visualize structural imperfections with a resolution of approximately 1 micrometer. The configuration, however, can easily be adapted for sub-micrometer resolution.

0 citations0 reviewsNo code linkedOpen access