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Manuel Sanchez del Rio

Manuel Sanchez del Rio appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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physics.optics cond-mat.mtrl-sci physics.acc-ph physics.ins-det

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preprint2022arXiv

Tilting refractive x-ray lenses for fine-tuning their focal length

In this work, we measure and model tilted x-ray refractive lenses to investigate their effects on an x-ray beam. The modelling is benchmarked against at-wavelength metrology obtained with x-ray speckle vector tracking experiments (XSVT) at the BM05 beamline at the ESRF-EBS light source, showing very good agreement. This validation permits us to explore possible applications of tilted x-ray lenses in optical design: we demonstrate that tilting 1D lenses around their focusing direction can be used for fine-tuning their focal length with possible applications in beamline optical design.

preprint2021arXiv

X-ray focusing by bent crystals: focal positions as predicted by the crystal lens equation and the dynamical diffraction theory

The location of the beam focus when monochromatic x-ray radiation is diffracted by a thin bent crystal is predicted by "crystal lens equation". We derive this equation in a general form valid for Bragg and Laue geometries. This equation has little utility for diffraction in Laue geometry. The focusing effect in the Laue symmetrical case is discussed using concepts of dynamical theory and an extension of the lens equation is proposed. The existence of polychromatic focusing is considered and the feasibility of matching the polychromatic and monochromatic focal positions is discussed.

preprint2020arXiv

Recent developments in X-ray lens modelling with SRW

The advent of 4$^\text{th}$ generation high-energy synchrotron facilities (ESRF-EBS and the planned APS-U, PETRA-IV and SPring-8 II) and free-electron lasers (Eu-XFEL and SLAC) allied with the recent demonstration of high-quality free-form refractive optics for beam shaping and optical correction has revived interest in compound refractive lenses (CRLs) as optics for beam transport, probe formation in X-ray micro- and nano-analysis as well as for imaging applications. Ideal CRLs have long been made available in the 'Synchrotron Radiation Workshop' (SRW), however, the current context requires more sophisticated modelling of X-ray lenses. In this work, we revisit the already implemented wave-optics model for an ideal X-ray lens in the projection approximation and propose modifications to it as to allow more degrees of freedom to both the front and back surfaces independently, which enables to reproduce misalignments and manufacturing errors commonly found in X-ray lenses. For the cases where simply tilting and transversely offsetting the parabolic sections of a CRL is not enough, we present the possibility of generating the figure errors by using Zernike and Legendre polynomials or directly adding metrology data to the lenses. We present the effects of each new degree of freedom by calculating their impact on point spread function and the beam caustics.

preprint2019arXiv

Modelling phase imperfections in compound refractive lenses

Compound refractive lenses (CRL) offer outstanding potential for probe formation in X-ray micro- and nano-analysis as well as for imaging applications, but effective aberration-free focusing of X-rays is a key consideration when high spatial resolution and intensities are required. Available refractive optics have non-negligible aberrations which degrade their final performance. We describe a framework based on physical-optics for simulating the effect of imperfect CRL upon an X-ray beam, taking into account measured phase errors obtained from at-wavelength metrology. We model, with increasing complexity, a CRL stack as a single thin phase element, then as a more realistic compound-element including absorption and thickness effects and finally, we add realistic optical imperfections to the CRL. Coherent and partially-coherent simulations using the "Synchrotron Radiation Workshop" (SRW) are used to evaluate the different models, the effects of the phase errors and to check the validity of the design equations and suitability of the figures of merit.

preprint2015arXiv

Simulation of X-ray diffraction profiles for bent anisotropic crystals

The equations for calculating diffraction profiles for bent crystals are revisited for both meridional and sagittal bending. Two approximated methods for computing diffraction profiles are treated: multilamellar and Penning-Polder. A common treatment of crystal anisotropy is included in these models. The formulation presented is implemented into the XOP package, completing and updating the crystal module that simulates diffraction profiles for perfect, mosaic and now distorted crystals by elastic bending.