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Sebastien Berujon

Sebastien Berujon appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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physics.optics physics.app-ph physics.ins-det physics.med-ph

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preprint2020arXiv

Single-shot x-ray speckle-based imaging of a single-material object

We develop a means for speckle-based phase imaging of the projected thickness of a single-material object, under the assumption of illumination by spatially random time-independent x-ray speckles. These speckles are generated by passing x rays through a suitable spatially random mask. The method makes use of a single image obtained in the presence of the object, which serves to deform the illuminating speckle field relative to a reference speckle field (which only needs to be measured once) obtained in the presence of the mask and the absence of the object. The method implicitly rather than explicitly tracks speckles, and utilizes the transport-of-intensity equation to give a closed-form solution to the inverse problem of determining the complex transmission function of the object. Implementation using x-ray synchrotron data shows the method to be robust and efficient with respect to noise. Applications include x-ray phase--amplitude radiography and tomography, as well as time-dependent imaging of dynamic and radiation-sensitive samples using low-flux sources.

preprint2020arXiv

X-ray optics and beam characterization using random modulation: Theory

X-ray near-field speckle-based phase-sensing approaches provide efficient means to characterise optical elements. Here, we present a theoretical review of several of these speckle methods in the frame of optical characterisation and provide a generalization of the concept. As we also demonstrate experimentally in another paper, the methods theoretically developed here can be applied with different beams and optics and within a variety of situations where at-wavelength metrology is desired. By understanding the differences between the various processing methods, it is possible to find and implement the best suited approach for each metrology scenario.

preprint2019arXiv

Modelling phase imperfections in compound refractive lenses

Compound refractive lenses (CRL) offer outstanding potential for probe formation in X-ray micro- and nano-analysis as well as for imaging applications, but effective aberration-free focusing of X-rays is a key consideration when high spatial resolution and intensities are required. Available refractive optics have non-negligible aberrations which degrade their final performance. We describe a framework based on physical-optics for simulating the effect of imperfect CRL upon an X-ray beam, taking into account measured phase errors obtained from at-wavelength metrology. We model, with increasing complexity, a CRL stack as a single thin phase element, then as a more realistic compound-element including absorption and thickness effects and finally, we add realistic optical imperfections to the CRL. Coherent and partially-coherent simulations using the "Synchrotron Radiation Workshop" (SRW) are used to evaluate the different models, the effects of the phase errors and to check the validity of the design equations and suitability of the figures of merit.

preprint2019arXiv

X-ray optics and beam characterisation using random modulation: Experiments

In a previous paper, we reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. We here show experimental applications of the technique for characterising both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with minimum amount of wavefront distortion. We also recall how such methods can facilitate online optimization of active optics.

preprint2016arXiv

X-Ray Multimodal Tomography Using Speckle-Vector Tracking

We demonstrate computerized tomography (CT) reconstructions from absorption, phase and dark-field signals obtained from scans acquired when the x-ray probe light is modulated with speckle. Two different interlaced schemes are proposed to reduce the number of sample exposures. First, the already demonstrated x-ray speckle-vector tracking (XSVT) concept for projection imaging allows the three signal CT reconstructions from multiple images per projection. Second, a modified XSVT approach is shown to provide absorption and phase reconstructions, this time from a single image per angular projection. Reconstructions from data obtained at a synchrotron facility emphasize the potential of the approaches for the imaging of complex samples.

preprint2015arXiv

Near-field speckle-scanning-based x-ray imaging

The x-ray near-field speckle-scanning concept is an approach recently introduced to obtain absorption, phase, and dark-field images of a sample. In this paper, we present ways of recovering from a sample its ultrasmall-angle x-ray scattering distribution using numerical deconvolution. We also show how to access the 2D phase gradient signal from random step scans, the latter having the potential to elude the flat-field correction error. Each feature is explained theoretically and demonstrated experimentally at a synchrotron x-ray facility.