Researcher profile

E. Edwards

E. Edwards contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2014arXiv

Vertical beam size measurement in the CESR-TA $e^+e^-$ storage ring using x-rays from synchrotron radiation

We describe the construction and operation of an x-ray beam size monitor (xBSM), a device measuring $e^+$ and $e^-$ beam sizes in the CESR-TA storage ring using synchrotron radiation. The device can measure vertical beam sizes of $10-100~μ$m on a turn-by-turn, bunch-by-bunch basis at $e^\pm$ beam energies of $\sim2~$GeV. At such beam energies the xBSM images x-rays of $ε\approx$1-10$~$keV ($λ\approx 0.1-1$ nm) that emerge from a hard-bend magnet through a single- or multiple-slit (coded aperture) optical element onto an array of 32 InGaAs photodiodes with 50$~μ$m pitch. Beamlines and detectors are entirely in-vacuum, enabling single-shot beam size measurement down to below 0.1$~$mA ($2.5\times10^9$ particles) per bunch and inter-bunch spacing of as little as 4$~$ns. At $E_{\rm b}=2.1 $GeV, systematic precision of $\sim 1~μ$m is achieved for a beam size of $\sim12~μ$m; this is expected to scale as $\propto 1/σ_{\rm b}$ and $\propto 1/E_{\rm b}$. Achieving this precision requires comprehensive alignment and calibration of the detector, optical elements, and x-ray beam. Data from the xBSM have been used to extract characteristics of beam oscillations on long and short timescales, and to make detailed studies of low-emittance tuning, intra-beam scattering, electron cloud effects, and multi-bunch instabilities.

preprint2012arXiv

Improving the Quality Factor of Microwave Compact Resonators by Optimizing their Geometrical Parameters

Applications in quantum information processing and photon detectors are stimulating a race to produce the highest possible quality factor on-chip superconducting microwave resonators. We have tested the surface-dominated loss hypothesis by systematically studying the role of geometrical parameters on the internal quality factors of compact resonators patterned in Nb on sapphire. Their single-photon internal quality factors were found to increase with the distance between capacitor fingers, the width of the capacitor fingers, and the impedance of the resonator. Quality factors were improved from 210,000 to 500,000 at T = 200 mK. All of these results are consistent with our starting hypothesis.