Abstract

We describe the construction and operation of an x-ray beam size monitor (xBSM), a device measuring e+e^+ and e−e^- beam sizes in the CESR-TA storage ring using synchrotron radiation. The device can measure vertical beam sizes of 10−100 μ10-100~μm on a turn-by-turn, bunch-by-bunch basis at e±e^\pm beam energies of ∼2 \sim2~GeV. At such beam energies the xBSM images x-rays of ε≈ε\approx1-10 ~keV (λ≈0.1−1λ\approx 0.1-1 nm) that emerge from a hard-bend magnet through a single- or multiple-slit (coded aperture) optical element onto an array of 32 InGaAs photodiodes with 50 μ~μm pitch. Beamlines and detectors are entirely in-vacuum, enabling single-shot beam size measurement down to below 0.1 ~mA (2.5×1092.5\times10^9 particles) per bunch and inter-bunch spacing of as little as 4 ~ns. At Eb=2.1E_{\rm b}=2.1 GeV, systematic precision of ∼1 μ\sim 1~μm is achieved for a beam size of ∼12 μ\sim12~μm; this is expected to scale as ∝1/σb\propto 1/σ_{\rm b} and ∝1/Eb\propto 1/E_{\rm b}. Achieving this precision requires comprehensive alignment and calibration of the detector, optical elements, and x-ray beam. Data from the xBSM have been used to extract characteristics of beam oscillations on long and short timescales, and to make detailed studies of low-emittance tuning, intra-beam scattering, electron cloud effects, and multi-bunch instabilities.

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