Abstract
Two-dimensional transition metal dichalcogenides (TMDCs) have properties attractive for optoelectronic and quantum applications. A crucial element for devices is the metal-semiconductor interface. However, high contact resistances have hindered progress. Quantum transport studies are scant as low-quality contacts are intractable at cryogenic temperatures. Here, temperature-dependent transfer length measurements are performed on chemical vapour deposition grown single-layer and bilayer WS devices with indium alloy contacts. The devices exhibit low contact resistances and Schottky barrier heights (\sim10 k\si{\micro\metre} at 3 K and 1.7 meV). Efficient carrier injection enables high carrier mobilities (190 cmVs) and observation of resonant tunnelling. Density functional theory calculations provide insights into quantum transport and properties of the WS-indium interface. Our results reveal significant advances towards high-performance WS devices using indium alloy contacts.
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