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Zhenyuan Liu

Zhenyuan Liu contributes to research discovery and scholarly infrastructure.

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Published work

4 published item(s)

preprint2023arXiv

Propagation of Input Tail Uncertainty in Rare-Event Estimation: A Light versus Heavy Tail Dichotomy

We consider the estimation of small probabilities or other risk quantities associated with rare but catastrophic events. In the model-based literature, much of the focus has been devoted to efficient Monte Carlo computation or analytical approximation assuming the model is accurately specified. In this paper, we study a distinct direction on the propagation of model uncertainty and how it impacts the reliability of rare-event estimates. Specifically, we consider the basic setup of the exceedance of i.i.d. sum, and investigate how the lack of tail information of each input summand can affect the output probability. We argue that heavy-tailed problems are much more vulnerable to input uncertainty than light-tailed problems, reasoned through their large deviations behaviors and numerical evidence. We also investigate some approaches to quantify model errors in this problem using a combination of the bootstrap and extreme value theory, showing some positive outcomes but also uncovering some statistical challenges.

preprint2022arXiv

Gate-Level Side-Channel Leakage Assessment with Architecture Correlation Analysis

While side-channel leakage is traditionally evaluated from a fabricated chip, it is more time-efficient and cost-effective to do so during the design phase of the chip. We present a methodology to rank the gates of a design according to their contribution to the side-channel leakage of the chip. The methodology relies on logic synthesis, logic simulation, gate-level power estimation, and gate leakage assessment to compute a ranking. The ranking metric can be defined as a specific test by correlating gate-level activity with a leakage model, or else as a non-specific test by evaluating gate-level activity in response to distinct test vector groups. Our results show that only a minority of the gates in a design contribute most of the side-channel leakage. We demonstrate this property for several designs, including a hardware AES coprocessor and a cryptographic hardware/software interface in a five-stage pipelined RISC processor.

preprint2022arXiv

Leverage the Average: Averaged Sampling in Pre-Silicon Side-Channel Leakage Assessment

Pre-silicon side-channel leakage assessment is a useful tool to identify hardware vulnerabilities at design time, but it requires many high-resolution power traces and increases the power simulation cost of the design. By downsampling and averaging these high-resolution traces, we show that the power simulation cost can be considerably reduced without significant loss of side-channel leakage assessment quality. We introduce a theoretical basis for our claims. Our results demonstrate up to 6.5-fold power-simulation speed improvement on a gate-level side-channel leakage assessment of a RISC-V SoC. Furthermore, we clarify the conditions under which the averaged sampling technique can be successfully used.

preprint2022arXiv

Test Against High-Dimensional Uncertainties: Accelerated Evaluation of Autonomous Vehicles with Deep Importance Sampling

Evaluating the performance of autonomous vehicles (AV) and their complex subsystems to high precision under naturalistic circumstances remains a challenge, especially when failure or dangerous cases are rare. Rarity does not only require an enormous sample size for a naive method to achieve high confidence estimation, but it also causes dangerous underestimation of the true failure rate and it is extremely hard to detect. Meanwhile, the state-of-the-art approach that comes with a correctness guarantee can only compute an upper bound for the failure rate under certain conditions, which could limit its practical uses. In this work, we present Deep Importance Sampling (Deep IS) framework that utilizes a deep neural network to obtain an efficient IS that is on par with the state-of-the-art, capable of reducing the required sample size 43 times smaller than the naive sampling method to achieve 10% relative error and while producing an estimate that is much less conservative. Our high-dimensional experiment estimating the misclassification rate of one of the state-of-the-art traffic sign classifiers further reveals that this efficiency still holds true even when the target is very small, achieving over 600 times efficiency boost. This highlights the potential of Deep IS in providing a precise estimate even against high-dimensional uncertainties.