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Eric Ziegler

Eric Ziegler appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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physics.optics physics.app-ph physics.ins-det

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preprint2020arXiv

X-ray optics and beam characterization using random modulation: Theory

X-ray near-field speckle-based phase-sensing approaches provide efficient means to characterise optical elements. Here, we present a theoretical review of several of these speckle methods in the frame of optical characterisation and provide a generalization of the concept. As we also demonstrate experimentally in another paper, the methods theoretically developed here can be applied with different beams and optics and within a variety of situations where at-wavelength metrology is desired. By understanding the differences between the various processing methods, it is possible to find and implement the best suited approach for each metrology scenario.

preprint2019arXiv

X-ray optics and beam characterisation using random modulation: Experiments

In a previous paper, we reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. We here show experimental applications of the technique for characterising both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with minimum amount of wavefront distortion. We also recall how such methods can facilitate online optimization of active optics.

preprint2016arXiv

X-Ray Multimodal Tomography Using Speckle-Vector Tracking

We demonstrate computerized tomography (CT) reconstructions from absorption, phase and dark-field signals obtained from scans acquired when the x-ray probe light is modulated with speckle. Two different interlaced schemes are proposed to reduce the number of sample exposures. First, the already demonstrated x-ray speckle-vector tracking (XSVT) concept for projection imaging allows the three signal CT reconstructions from multiple images per projection. Second, a modified XSVT approach is shown to provide absorption and phase reconstructions, this time from a single image per angular projection. Reconstructions from data obtained at a synchrotron facility emphasize the potential of the approaches for the imaging of complex samples.

preprint2015arXiv

Near-field speckle-scanning-based x-ray imaging

The x-ray near-field speckle-scanning concept is an approach recently introduced to obtain absorption, phase, and dark-field images of a sample. In this paper, we present ways of recovering from a sample its ultrasmall-angle x-ray scattering distribution using numerical deconvolution. We also show how to access the 2D phase gradient signal from random step scans, the latter having the potential to elude the flat-field correction error. Each feature is explained theoretically and demonstrated experimentally at a synchrotron x-ray facility.