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Carsten Detlefs

Carsten Detlefs appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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cond-mat.mtrl-sciphysics.opticsphysics.ins-detcond-mat.mes-hall

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Published work

10 published item(s)

preprint2022arXiv

darfix: Data analysis for dark-field X-ray microscopy

A Python package for the analysis of dark-field X-ray microscopy (DFXM) and rocking curve imaging (RCI) data is presented. \textit{darfix} provides a set of data processing and visualization tools that can be either imported as library components or accessed through a graphical user interface (GUI) as an Orange add-on. In the latter case, the different analysis modules can be easily chained to define computational workflows. Operations on larger-than-memory image sets are supported through the implementation of online versions of the data processing algorithms, effectively trading performance for feasibility when the computing resources are limited. The software can automatically extract the relevant instrument angle settings from the input files metadata. The currently available input file format is EDF and in future releases HDF5 will be incorporated.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

Extensive 3D Mapping of Dislocation Structures in Bulk Aluminum

Thermomechanical processing such as annealing is one of the main methods to tailor the mechanical properties of materials, however, much is unknown about the reorganization of dislocation structures deep inside macroscopic crystals that give rise to those changes. Here, we demonstrate the self-organization of dislocation structures upon high-temperature annealing in a mm-sized single crystal of aluminum. We map a large embedded 3D volume ($100\times300\times300$ $μ$m$^3$) of dislocation structures using dark field x-ray microscopy (DFXM), a diffraction-based imaging technique. Over the wide field of view, DFXM's high angular resolution allows us to identify subgrains, separated by dislocation boundaries, which we identify and characterize down to the single-dislocation level using computer-vision methods. We demonstrate how even after long annealing times at high temperatures, the remaining low density of dislocations still pack into well-defined, straight dislocation boundaries (DBs) that lie on specific crystallographic planes. In contrast to conventional grain growth models, our results show that the dihedral angles at the triple junctions are not the predicted 120$\degree$, suggesting additional complexities in the boundary stabilization mechanisms. Mapping the local misorientation and lattice strain around these boundaries shows that the observed strain is shear, imparting an average misorientation around the DB of $\approx 0.003-0.006 \degree{}$

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

Simulating dark-field x-ray microscopy images with wave front propagation techniques

Dark-Field X-ray Microscopy (DFXM) is a diffraction-based synchrotron imaging techique capable of imaging defects in the bulk of extended crystalline samples. We present numerical simulations of image-formation in such a microscope using numerical integration of the dynamical Takagi-Taupin Equations (TTE) and wave front propagation. We validate our approach by comparing simulated images to experimental data from a near-perfect single crystal of diamond containing a single stacking fault defect in the illuminated volume.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

Tilting refractive x-ray lenses for fine-tuning their focal length

In this work, we measure and model tilted x-ray refractive lenses to investigate their effects on an x-ray beam. The modelling is benchmarked against at-wavelength metrology obtained with x-ray speckle vector tracking experiments (XSVT) at the BM05 beamline at the ESRF-EBS light source, showing very good agreement. This validation permits us to explore possible applications of tilted x-ray lenses in optical design: we demonstrate that tilting 1D lenses around their focusing direction can be used for fine-tuning their focal length with possible applications in beamline optical design.

0 citations0 reviewsNo code linkedOpen access
preprint2018arXiv

X-ray coherent diffraction imaging with an objective lens: towards 3D mapping of thick polycrystals

We report on a new x-ray imaging method, which combines the high spatial resolution of coherent diffraction imaging with the ability of dark field microscopy to map grains within thick polycrystalline specimens. An x-ray objective serves to isolate a grain and avoid overlap of diffraction spots. Iterative oversampling routines are used to reconstruct the shape and strain field within the grain from the far field intensity pattern. The limitation on resolution caused by the finite numerical aperture of the objective is overcome by the Fourier synthesis of several diffraction patterns. We demonstrate the method by an experimental study of a ~500 nm Pt grain for the two cases of a real and a virtual image plane. In the latter case the spatial resolution is 13 nm rms. Our results confirm that no information on the pupil function of the lens is required and that lens aberrations are not critical.

0 citations0 reviewsNo code linkedOpen access
preprint2016arXiv

Extended formalism for simulating compound refractive lens-based x-ray microscopes

We present a comprehensive formalism for the simulation and optimisation of CRLs in both condensing and full-field imaging configurations. The approach extends ray transfer matrix analysis to account for x-ray attenuation by the lens material. Closed analytical expressions for critical imaging parameters such as numerical aperture, vignetting, chromatic aberration and focal length are provided for both thin- and thick-lens imaging geometries.

0 citations0 reviewsNo code linkedOpen access
preprint2016arXiv

High Resolution Hard X-ray Magnetic Imaging with Dichroic Ptychography

Imaging the magnetic structure of a material is essential to understanding the influence of the physical and chemical microstructure on its magnetic properties. Magnetic imaging techniques, however, have up to now been unable to probe 3D micrometer-sized systems with nanoscale resolution. Here we present the imaging of the magnetic domain configuration of a micrometre-thick FeGd multilayer with hard X-ray dichroic ptychography at energies spanning both the Gd L3 edge and the Fe K edge, providing a high spatial resolution spectroscopic analysis of the complex X-ray magnetic circular dichroism. With a spatial resolution reaching 45 nm, this advance in hard X-ray magnetic imaging is the first step towards the investigation of buried magnetic structures and extended three-dimensional magnetic systems at the nanoscale.

0 citations0 reviewsNo code linkedOpen access
preprint2015arXiv

Full-field hard x-ray microscopy with interdigitated silicon lenses

Full-field x-ray microscopy using x-ray objectives has become a mainstay of the biological and materials sciences. However, the inefficiency of existing objectives at x-ray energies above 15 keV has limited the technique to weakly absorbing or two-dimensional (2D) samples. Here, we show that significant gains in numerical aperture and spatial resolution may be possible at hard x-ray energies by using silicon-based optics comprising 'interdigitated' refractive silicon lenslets that alternate their focus between the horizontal and vertical directions. By capitalizing on the nano-manufacturing processes available to silicon, we show that it is possible to overcome the inherent inefficiencies of silicon-based optics and interdigitated geometries. As a proof-of-concept of Si-based interdigitated objectives, we demonstrate a prototype interdigitated lens with a resolution of ~255 nm at 17 keV.

0 citations0 reviewsNo code linkedOpen access
preprint2014arXiv

Crystallographic investigation of Au nanoparticles embedded in a SrTiO$_3$ thin film for plasmonics applications by means of synchrotron radiation

Self-organized monocrystalline Au nanoparticles with potential applications in plasmonics are grown in a SrTiO$_3$ matrix by a novel two-step deposition process. The crystalline preferred orientation of these Au nanoparticles is investigated by synchrotron hard x-ray diffraction. Nanoparticles preferentially align with the (111) direction along the substrate normal (001), whereas two in-plane orientations are found with $[110]_{SrTiO_3} \: || \: [110]_{Au}$ and $[100]_{SrTiO_3} \: || \: [110]_{Au}$. Additionally, a smaller diffraction signal from nanoparticles with the (001) direction parallel to the substrate normal (001) is observed; once again, two in-plane orientations are found, with $[100]_{SrTiO_3} \: || \: [100]_{Au}$ and $[100]_{SrTiO_3} \: || \: [110]_{Au}$. The populations of the two in-plane orientations are found to depend on the thickness of the gold film deposited in the first step of the growth.

0 citations0 reviewsNo code linkedOpen access
preprint2014arXiv

X-ray diffraction microscopy based on refractive optics

We describe a diffraction microscopy technique based on refractive optics to study structural variations in crystals. The X-ray beam diffracted by a crystal was magnified by beryllium parabolic refractive lenses on a 2D X-ray camera. The microscopy setup was integrated into the 6-circle Huber diffractometer at the ESRF beamline ID06. Our setup allowed us to visualize structural imperfections with a resolution of approximately 1 micrometer. The configuration, however, can easily be adapted for sub-micrometer resolution.

0 citations0 reviewsNo code linkedOpen access