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Researcher profile

Hans Werner Schumacher

Hans Werner Schumacher contributes to research discovery and scholarly infrastructure.

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cond-mat.mes-hallphysics.app-phphysics.data-anphysics.ins-det

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Published work

8 published item(s)

preprint2026arXiv

On the influence of reference sample properties on magnetic force microscopy calibrations

Magnetic force microscopy (MFM) allows the characterization of magnetic stray field distributions with high sensitivity and spatial resolution. Based on a suitable calibration procedure, MFM can also yield quantitative magnetic field values. This process typically involves measuring a reference sample to determine the distribution of the tip's stray field or stray field gradient at the sample surface. This distribution is called the tip transfer function (TTF) and is derived through regularized deconvolution in Fourier space. The properties of the reference sample and the noise characteristics of the detection system significantly influence the derived TTF, thereby limiting its validity range. In a recent study, the tip stray field distribution, and hence the TTF, of an MFM tip was independently measured in real space using a nitrogen vacancy center as a quantum sensor, revealing considerable discrepancies with the reference-sample-based TTF. Here, we analyze the influence of the feature distribution of the reference sample and the MFM measurement parameters on the resulting TTF. We explain the observed differences between quantum-calibrated stray field distributions and the classical approach by attributing them to a loss of information due to missing or suppressed spectral components. Furthermore, we emphasize the importance of the spectral coverage of the TTF. Our findings indicate that for high-quality reconstruction of the stray field of a sample under test (SUT), it is more critical to ensure a strong overlap of frequency components between the reference sample and the SUT than to achieve an accurate real-space reconstruction of the tip stray field distribution.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

A Ti/Pt/Co multilayer stack for transfer function based magnetic force microscopy calibrations

Magnetic force microscopy is a widespread technique for imaging magnetic structures with a resolution of some 10 nanometers. MFM can be calibrated to obtain quantitative spatially resolved magnetization data in units of A/m by determining the calibrated point spread function of the instrument, its instrument calibration function (ICF), from a measurement of a well-known reference sample. Beyond quantifying the MFM data, a deconvolution of the MFM image data with the ICF also corrects the smearing caused by the finite width of the MFM tip stray field distribution. However, the quality of the calibration depends critically on the calculability of the magnetization distribution of the reference sample. Here, we discuss a Ti/Pt/Co multilayer stack that shows a stripe domain pattern as a suitable reference material. A precise control of the fabrication process, combined with a characterization of the sample micromagnetic parameters, allows reliable calculation of the sample's magnetic stray field, proven by a very good agreement between micromagnetic simulations and qMFM measurements. A calibrated qMFM measurement using the Ti/Pt/Co stack as a reference sample is shown and validated, and the application area for quantitative MFM measurements calibrated with the Ti/Pt/Co stack is discussed

0 citations0 reviewsNo code linkedOpen access
preprint2021arXiv

Magnetic field robust high quality factor NbTiN superconducting microwave resonators

We systematically study the performance of compact lumped element planar microwave $\mathrm{Nb_{70}Ti_{30}N}$ (NbTiN) resonators operating at 5 GHz in external in-plane magnetic fields up to 440 mT, a broad temperature regime from 2.2 K up to 13 K, as well as mK temperatures. For comparison, the resonators have been fabricated on thermally oxidized and pristine, (001) oriented silicon substrates. When operating the resonators in the multi-photon regime at $T=2.2$ K, we find internal quality factors $Q_{\mathrm{int}}\simeq$ $2\cdot10^5$ for NbTiN resonators grown on pristine Si substrates, while resonators grown on thermally oxidized substrates show a reduced value of $Q_{\mathrm{int}}\simeq$ $1\cdot10^4$, providing evidence for additional loss channels for the latter substrate. In addition, we investigate the $Q$-factors of the resonators on pristine Si substrates at millikelvin temperatures to asses their applicability for quantum applications. We find $Q_{\mathrm{int}}\simeq$ $2\cdot10^5$ in the single photon regime and $Q_{\mathrm{int}}\simeq$ $5\cdot10^5$ in the high power regime at $T=7$ mK.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Substrate induced nanoscale resistance variation in epitaxial graphene

Graphene, the first true two-dimensional material still reveals the most remarkable transport properties among the growing class of two-dimensional materials. Although many studies have investigated fundamental scattering processes, the surprisingly large variation in the experimentally determined resistances associated with a localized defect is still an open issue. Here, we quantitatively investigate the local transport properties of graphene prepared by polymer assisted sublimation growth (PASG) using scanning tunneling potentiometry. PASG graphene is characterized by a spatially homogeneous current density, which allows to analyze variations in the local electrochemical potential with high precision. We utilize this possibility by examining the local sheet resistance finding a significant variation of up to 270% at low temperatures. We identify a correlation of the sheet resistance with the stacking sequence of the 6H-SiC substrate as well as with the distance between the graphene sheet and the substrate. Our results experimentally quantify the strong impact of the graphene-substrate interaction on the local transport properties of graphene.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Uncertainty Analysis of Stray Field Measurements by Quantitative Magnetic Force Microscopy

Magnetic force microscopy (MFM) measurements generally provide phase images which represent the signature of domain structures on the surface of nanomaterials. To quantitatively determine magnetic stray fields based on an MFM image requires calibrated properties of the magnetic tip. In this work, an approach is presented for calibrating a magnetic tip using a Co/Pt multilayered film as a reference sample which shows stable well-known magnetic properties and well-defined perpendicular band domains. The approach is based on a regularized deconvolution process in Fourier domain with a Wiener filter and the L-curve method for determining a suitable regularization parameter to get a physically reasonable result. The calibrated tip is applied for a traceable quantitative determination of the stray fields of a test sample which has a patial frequency spectrum covered by that of the reference sample. According to the "Guide to the expression of uncertainty in measurement", uncertainties of the processing algorithm are estimated considering the fact that the regularization influences significantly the quantitative analysis. We discuss relevant uncertainty components and their propagations between real domain and Fourier domain for both, the tip calibration procedure and the stray field calculation, and propose an uncertainty evaluation procedure for quantitative magnetic force microscopy.

0 citations0 reviewsNo code linkedOpen access
preprint2013arXiv

Towards wafer scale inductive determination of magnetostatic and dynamic parameters of magnetic thin films and multilayers

We investigate an inductive probe head suitable for non-invasive characterization of the magnetostatic and dynamic parameters of magnetic thin films and multilayers on the wafer scale. The probe is based on a planar waveguide with rearward high frequency connectors that can be brought in close contact to the wafer surface. Inductive characterization of the magnetic material is carried out by vector network analyzer ferromagnetic resonance. Analysis of the field dispersion of the resonance allows the determination of key material parameters such as the saturation magnetization MS or the effective damping parameter Meff. Three waveguide designs are tested. The broadband frequency response is characterized and the suitability for inductive determination of MS and Meff is compared. Integration of such probes in a wafer prober could in the future allow wafer scale in-line testing of magnetostatic and dynamic key material parameters of magnetic thin films and multilayers.

0 citations0 reviewsNo code linkedOpen access
preprint2011arXiv

Integrated quantized electronics: a semiconductor quantized voltage source

The Josephson effect in superconductors links a quantized output voltage Vout = f \cdot(h/2e) to the natural constants of the electron's charge e, Planck's constant h, and to an excitation frequency f with important applications in electrical quantum metrology. Also semiconductors are routinely applied in electrical quantum metrology making use of the quantum Hall effect. However, despite their broad range of further applications e.g. in integrated circuits, quantized voltage generation by a semiconductor device has never been obtained. Here we report a semiconductor quantized voltage source generating quantized voltages Vout = f\cdot(h/e). It is based on an integrated quantized circuit of a single electron pump operated at pumping frequency f and a quantum Hall device monolithically integrated in series. The output voltages of several \muV are expected to be scalable by orders of magnitude using present technology. The device might open a new route towards the closure of the quantum metrological triangle. Furthermore it represents a universal electrical quantum reference allowing to generate quantized values of the three most relevant electrical units of voltage, current, and resistance based on fundamental constants using a single device.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Quantitative measurement of the magnetic moment of an individual magnetic nanoparticle by magnetic force microscopy

We demonstrate the quantitative measurement of the magnetization of individual magnetic nanoparticles (MNP) using a magnetic force microscope (MFM). The quantitative measurement is realized by calibration of the MFM signal using an MNP reference sample with traceably determined magnetization. A resolution of the magnetic moment of the order of 10^(-18) Am^2 under ambient conditions is demonstrated which is presently limited by the tip's magnetic moment and the noise level of the instrument. The calibration scheme can be applied to practically any MFM and tip thus allowing a wide range of future applications e.g. in nanomagnetism and biotechnology.

0 citations0 reviewsNo code linkedOpen access