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Hugh Simons

Hugh Simons appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record
cond-mat.mtrl-sciphysics.opticsphysics.app-phphysics.comp-ph

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Published work

5 published item(s)

preprint2022arXiv

A finite difference scheme for integrating the Takagi-Taupin equations on an arbitrary orthogonal grid

Calculating dynamical diffraction patterns for X-ray topography and similar x-ray scattering-imaging techniques require the numerical integration of the Takagi-Taupin equations. This is usually performed with a simple second order finite difference scheme on a sheared computational grid with two of the axes aligned with the wave vectors of the incident and scattered beams respectively. This dictates, especially at low scattering angles, an oblique grid of uneven step-sizes. Here we present a finite difference scheme that carries out this integration in slab-shaped samples on an arbitrary orthogonal grid by implicitly utilizing Fourier interpolation. The scheme achieves the expected second order convergence and a similar error to the traditional approach on similarly dense grids.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

Simulating dark-field x-ray microscopy images with wave front propagation techniques

Dark-Field X-ray Microscopy (DFXM) is a diffraction-based synchrotron imaging techique capable of imaging defects in the bulk of extended crystalline samples. We present numerical simulations of image-formation in such a microscope using numerical integration of the dynamical Takagi-Taupin Equations (TTE) and wave front propagation. We validate our approach by comparing simulated images to experimental data from a near-perfect single crystal of diamond containing a single stacking fault defect in the illuminated volume.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

Unveiling the interaction mechanisms of electron and X-ray radiation with halide perovskite semiconductors using scanning nano-probe diffraction

The interaction of high-energy electrons and X-ray photons with soft semiconductors such as halide perovskites is essential for the characterisation and understanding of these optoelectronic materials. Using nano-probe diffraction techniques, which can investigate physical properties on the nanoscale, we perform studies of the interaction of electron and X-ray radiation with state-of-the-art (FA$_{0.79}$MA$_{0.16}$Cs$_{0.05}$)Pb(I$_{0.83}$Br$_{0.17}$)$_3$ hybrid halide perovskite films (FA, formamidinium; MA, methylammonium). We track the changes in the local crystal structure as a function of fluence using scanning electron diffraction and synchrotron nano X-ray diffraction techniques. We identify perovskite grains from which additional reflections, corresponding to PbBr$_2$, appear as a crystalline degradation phase after fluences of ~200 e$^-$Å$^{-2}$. These changes are concomitant with the formation of small PbI$_2$ crystallites at the adjacent high-angle grain boundaries, with the formation of pinholes, and with a phase transition from tetragonal to cubic. A similar degradation pathway is caused by photon irradiation in nano-X-ray diffraction, suggesting common underlying mechanisms. Our approach explores the radiation limits of these materials and provides a description of the degradation pathways on the nanoscale. Addressing high-angle grain boundaries will be critical for the further improvement of halide polycrystalline film stability, especially for applications vulnerable to high-energy radiation such as space photovoltaics.

0 citations0 reviewsNo code linkedOpen access
preprint2016arXiv

Extended formalism for simulating compound refractive lens-based x-ray microscopes

We present a comprehensive formalism for the simulation and optimisation of CRLs in both condensing and full-field imaging configurations. The approach extends ray transfer matrix analysis to account for x-ray attenuation by the lens material. Closed analytical expressions for critical imaging parameters such as numerical aperture, vignetting, chromatic aberration and focal length are provided for both thin- and thick-lens imaging geometries.

0 citations0 reviewsNo code linkedOpen access
preprint2015arXiv

Full-field hard x-ray microscopy with interdigitated silicon lenses

Full-field x-ray microscopy using x-ray objectives has become a mainstay of the biological and materials sciences. However, the inefficiency of existing objectives at x-ray energies above 15 keV has limited the technique to weakly absorbing or two-dimensional (2D) samples. Here, we show that significant gains in numerical aperture and spatial resolution may be possible at hard x-ray energies by using silicon-based optics comprising 'interdigitated' refractive silicon lenslets that alternate their focus between the horizontal and vertical directions. By capitalizing on the nano-manufacturing processes available to silicon, we show that it is possible to overcome the inherent inefficiencies of silicon-based optics and interdigitated geometries. As a proof-of-concept of Si-based interdigitated objectives, we demonstrate a prototype interdigitated lens with a resolution of ~255 nm at 17 keV.

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