Abstract

We report x-ray resonant magnetic scattering (XRMS) and resonant inelastic x-ray scattering (RIXS) studies of epitaxially-strained Sr2IrO4\mathrm{Sr_2IrO_4} thin films. The films were grown on SrTiO3\mathrm{SrTiO_3} and (LaAlO3)0.3(Sr2AlTaO6)0.7\mathrm{(LaAlO_3)_{0.3}(Sr_2AlTaO_6)_{0.7}} substrates, under slight tensile and compressive strains, respectively. Although the films develop a magnetic structure reminiscent of bulk Sr2IrO4\mathrm{Sr_2IrO_4}, the magnetic correlations are extremely anisotropic, with in-plane correlation lengths significantly longer than the out-of-plane correlation lengths. In addition, the compressive (tensile) strain serves to suppress (enhance) the magnetic ordering temperature TN\mathrm{T_N}, while raising (lowering) the energy of the zone boundary magnon. Quantum chemical calculations show that the tuning of magnetic energy scales can be understood in terms of strain-induced change in bond lengths.

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