Abstract

We study the structure and learnability of sums of independent integer random variables (SIIRVs). For k∈Z+k \in \mathbb{Z}_{+}, a kk-SIIRV of order n∈Z+n \in \mathbb{Z}_{+} is the probability distribution of the sum of nn independent random variables each supported on {0,1,…,k−1}\{0, 1, \dots, k-1\}. We denote by Sn,k{\cal S}_{n,k} the set of all kk-SIIRVs of order nn. In this paper, we tightly characterize the sample and computational complexity of learning kk-SIIRVs. More precisely, we design a computationally efficient algorithm that uses O~(k/ε2)\widetilde{O}(k/ε^2) samples, and learns an arbitrary kk-SIIRV within error ε,ε, in total variation distance. Moreover, we show that the {\em optimal} sample complexity of this learning problem is Θ((k/ε2)log⁡(1/ε)).Θ((k/ε^2)\sqrt{\log(1/ε)}). Our algorithm proceeds by learning the Fourier transform of the target kk-SIIRV in its effective support. Its correctness relies on the {\em approximate sparsity} of the Fourier transform of kk-SIIRVs -- a structural property that we establish, roughly stating that the Fourier transform of kk-SIIRVs has small magnitude outside a small set. Along the way we prove several new structural results about kk-SIIRVs. As one of our main structural contributions, we give an efficient algorithm to construct a sparse {\em proper} εε-cover for Sn,k,{\cal S}_{n,k}, in total variation distance. We also obtain a novel geometric characterization of the space of kk-SIIRVs. Our characterization allows us to prove a tight lower bound on the size of εε-covers for Sn,k{\cal S}_{n,k}, and is the key ingredient in our tight sample complexity lower bound. Our approach of exploiting the sparsity of the Fourier transform in distribution learning is general, and has recently found additional applications.

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