Abstract

We analyzed low-background data from the CRESST-II experiment with a total net exposure of 730 kg days to extract limits on double electron capture processes. We established new limits for 40^{40}Ca with T1/22v2K>9.9×1021T_{1/2}^{2v2K}>9.9\times10^{21} y and T1/20v2EC>1.4×1022T_{1/2}^{0v2EC}>1.4\times10^{22} y and for 180^{180}W with T1/22v2K>3.1×1019_{1/2}^{2v2K}>3.1\times10^{19} y and T1/20v2EC>9.4×1018T_{1/2}^{0v2EC}>9.4\times10^{18} y at 90% CL. Depending on the process, these values improve the currently best limits by a factor of ∼\sim1.4-30.

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