Abstract
We present evidence for spin polarized charge carriers in InO films. Both InO and Cr doped InO films exhibit room temperature ferromagnetism after vacuum annealing, with a saturation moment of approximately 0.5 emu/cm. We used Point Contact Andreev Reflection measurements to directly determine the spin polarization, which was found to be approximately 505% for both compositions. These results are consistent with suggestions that the ferromagnetism observed in certain oxide semiconductors may be carrier mediated.
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