Abstract

We present evidence for spin polarized charge carriers in In2_2O3_3 films. Both In2_2O3_3 and Cr doped In2_2O3_3 films exhibit room temperature ferromagnetism after vacuum annealing, with a saturation moment of approximately 0.5 emu/cm3^3. We used Point Contact Andreev Reflection measurements to directly determine the spin polarization, which was found to be approximately 50±\pm5% for both compositions. These results are consistent with suggestions that the ferromagnetism observed in certain oxide semiconductors may be carrier mediated.

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