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Zdenek Matej

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2 published item(s)

preprint2026arXiv

Data acquisition from high-rate detectors at MAX IV

At MAX IV pixelated area detectors are operated at high frame rates to take advantage of the X-ray beam properties available from the fourth generation synchrotron in scattering, diffraction and imaging applications. A variety of photon counting and charge integrating detectors and sCMOS cameras have been integrated into a common data acquisition (DAQ) system in which data are streamed to a central Kubernetes cluster, mounting an IBM Storage Scale (GPFS) file system. The DAQ system provides live feedback from the detectors/cameras and extends to enable on-the-fly data processing. Control system integration via Tango provides a standardised single interface for controlling all DAQ components. Starting from an overview of the detector types in use, we describe the design and implementation of the MAX~IV detector-DAQ system and report a quantitative study of its performance in terms of data throughput and detector operating rates.

preprint2015arXiv

Powder diffraction in Bragg-Brentano geometry with straight linear detectors

A common way of speeding up powder diffraction measurements is the use of one or two dimensional detectors. This usually goes along with worse resolution and asymmetric peak profiles. In this work the influence of a straight linear detector on the resolution function in the Bragg-Brentano focusing geometry is discussed. Due to the straight nature of most modern detectors geometrical defocusing occurs which heavily influences the line shape of diffraction lines at low angles. An easy approach to limit the resolution degrading effects is presented. The presented algorithm selects an adaptive range of channels of the linear detector at low angles, resulting in increased resolution. At higher angles still the whole linear detector is used and the data collection remains fast. Using this algorithm a well-behaved resolution function is obtained in the full angular range, whereas using the full linear detector the resolution function varies within one pattern which hinders line shape and Rietveld analysis.