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Dominik Kriegner

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cond-mat.mtrl-sci cond-mat.mes-hall physics.ins-det physics.data-an

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preprint2021arXiv

Defect-driven antiferromagnetic domain walls in CuMnAs films

Efficient manipulation of antiferromagnetic (AF) domains and domain walls has opened up new avenues of research towards ultrafast, high-density spintronic devices. AF domain structures are known to be sensitive to magnetoelastic effects, but the microscopic interplay of crystalline defects, strain and magnetic ordering remains largely unknown. Here, we reveal, using photoemission electron microscopy combined with scanning X-ray diffraction imaging and micromagnetic simulations, that the AF domain structure in CuMnAs thin films is dominated by nanoscale structural twin defects. We demonstrate that microtwin defects, which develop across the entire thickness of the film and terminate on the surface as characteristic lines, determine the location and orientation of 180 degree and 90 degree domain walls. The results emphasize the crucial role of nanoscale crystalline defects in determining the AF domains and domain walls, and provide a route to optimizing device performance.

preprint2020arXiv

Investigation of Nanostructures with X-ray Scattering Techniques

The structural investigations of nanomaterials motivated by their large variety and diverse set of applications have attracted considerable attention. In particular, the ever-improving machinery, both in laboratory and at large scale facilities, together with the methodical improvements available for studying nanostructures ranging from epitaxial nanomaterials, nanocrystalline thin films and coatings, to nanoparticles and colloidal nanocrystals allows us to gain a more detailed understanding of their structural properties. As the structure essentially determines the physical properties of the materials, this advances the possibilities of structural studies and also enables a deeper understanding of the structure to property relationships. In this special issue entitled "Investigation of Nanostructures with X-ray Scattering Techniques" five contributions show the recent progress in various research fields. Contributions cover topics as diverse as neutron scattering on magnetic multilayer films, epitaxial orientation of organic thin films, nanoparticle ordering and chemical composition analysis, and the combination of nanofocused X-ray beams with electrical measurements.

preprint2020arXiv

Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl-semimetal Co2MnGa thin films

We report a robust anomalous Nernst effect in Co2MnGa thin films in the thickness regime between 20 and 50 nm. The anomalous Nernst coefficient varied in the range of -2.0 to -3.0 uV/K at 300 K. We demonstrate that the anomalous Hall and Nernst coefficients exhibit similar behavior and fulfill the Mott relation. We simultaneously measure all four transport coefficients of the longitudinal resistivity, transversal resistivity, Seebeck coefficient, and anomalous Nernst coefficient. We connect the values of the measured and calculated Nernst conductivity by using the remaining three magneto-thermal transport coefficients, where the Mott relation is still valid. The intrinsic Berry curvature dominates the transport due to the relation between the longitudinal and transversal transport. Therefore, we conclude that the Mott relationship is applicable to describe the magneto-thermoelectric transport in Weyl semimetal Co2MnGa as a function of film thickness.

preprint2019arXiv

Molecular beam epitaxy of CuMnAs

We present a detailed study of the growth of the tetragonal polymorph of antiferromagnetic CuMnAs by the molecular beam epitaxy technique. We explore the parameter space of growth conditions and their effect on the microstructural and transport properties of the material. We identify its typical structural defects and compare the properties of epitaxial CuMnAs layers grown on GaP, GaAs and Si substrates. Finally, we investigate the correlation between the crystalline quality of CuMnAs and its performance in terms of electrically induced resistance switching.

preprint2015arXiv

Powder diffraction in Bragg-Brentano geometry with straight linear detectors

A common way of speeding up powder diffraction measurements is the use of one or two dimensional detectors. This usually goes along with worse resolution and asymmetric peak profiles. In this work the influence of a straight linear detector on the resolution function in the Bragg-Brentano focusing geometry is discussed. Due to the straight nature of most modern detectors geometrical defocusing occurs which heavily influences the line shape of diffraction lines at low angles. An easy approach to limit the resolution degrading effects is presented. The presented algorithm selects an adaptive range of channels of the linear detector at low angles, resulting in increased resolution. At higher angles still the whole linear detector is used and the data collection remains fast. Using this algorithm a well-behaved resolution function is obtained in the full angular range, whereas using the full linear detector the resolution function varies within one pattern which hinders line shape and Rietveld analysis.

preprint2013arXiv

xrayutilities: A versatile tool for reciprocal space conversion of scattering data recorded with linear and area detectors

We present general algorithms to convert scattering data of linear and area detectors recorded in various scattering geometries to reciprocal space coordinates. The presented algorithms work for any goniometer configuration including popular four-circle, six-circle and kappa goniometers. We avoid the use of commonly employed approximations and therefore provide algorithms which work also for large detectors at small sample detector distances. A recipe for determining the necessary detector parameters including mostly ignored misalignments is given. The algorithms are implemented in a freely available open-source package.