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Subhasish Mitra

Subhasish Mitra appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record
Cryptography and SecurityHardware ArchitectureOther Computer ScienceDistributed, Parallel, and Cluster ComputingEmerging TechnologiesLogic in Computer Science

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Published work

7 published item(s)

preprint2022arXiv

An Exhaustive Approach to Detecting Transient Execution Side Channels in RTL Designs of Processors

Hardware (HW) security issues have been emerging at an alarming rate in recent years. Transient execution attacks, in particular, pose a genuine threat to the security of modern computing systems. Despite recent advances, understanding the intricate implications of microarchitectural design decisions on processor security remains a great challenge and has caused a number of update cycles in the past. number of update cycles in the past. This papers addresses the need for a new approach to HW sign-off verification which guarantees the security of processors at the Register Transfer Level (RTL). To this end, we introduce a formal definition of security with respect to transient execution attacks, formulated as a HW property. We present a formal proof methodology based on Unique Program Execution Checking (UPEC) which can be used to systematically detect all vulnerabilities to transient execution attacks in RTL designs. UPEC does not exploit any a priori knowledge on known attacks and can therefore detect also vulnerabilities based on new, so far unknown, types of channels. This is demonstrated by two new attack scenarios discovered in our experiments with UPEC. UPEC scales to a wide range of HW designs, including in-order processors (RocketChip), pipelines with out-of-order writeback (Ariane), and processors with deep out-of-order speculative execution (BOOM). To the best of our knowledge, UPEC is the first RTL verification technique that exhaustively covers transient execution side channels in processors of realistic complexity.

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preprint2022arXiv

Innovating at Speed and at Scale: A Next Generation Infrastructure for Accelerating Semiconductor Technologies

Semiconductor innovation drives improvements to technologies that are critical to modern society. The country that successfully accelerates semiconductor innovation is positioned to lead future semiconductor-driven industries and benefit from the resulting economic growth. It is our view that a next generation infrastructure is necessary to accelerate and enhance semiconductor innovation in the U.S. In this paper, we propose such an advanced infrastructure composed of a national network of facilities with enhancements in technology and business models. These enhancements enable application-driven and challenge-based research and development, and ensure that facilities are accessible and sustainable. The main tenets are: a challenge-driven operational model, a next-generation infrastructure to serve that operational model, technology innovations needed for advanced facilities to speed up learning cycles, and innovative cost-effective business models for sustainability. Ultimately, the expected outcomes of such a participatory, scalable, and sustainable nation-level advanced infrastructure will have tremendous impact on government, industry, and academia alike.

0 citations0 reviewsNo code linkedOpen access
preprint2021arXiv

Scaling Up Hardware Accelerator Verification using A-QED with Functional Decomposition

Hardware accelerators (HAs) are essential building blocks for fast and energy-efficient computing systems. Accelerator Quick Error Detection (A-QED) is a recent formal technique which uses Bounded Model Checking for pre-silicon verification of HAs. A-QED checks an HA for self-consistency, i.e., whether identical inputs within a sequence of operations always produce the same output. Under modest assumptions, A-QED is both sound and complete. However, as is well-known, large design sizes significantly limit the scalability of formal verification, including A-QED. We overcome this scalability challenge through a new decomposition technique for A-QED, called A-QED with Decomposition (A-QED$^2$). A-QED$^2$ systematically decomposes an HA into smaller, functional sub-modules, called sub-accelerators, which are then verified independently using A-QED. We prove completeness of A-QED$^2$; in particular, if the full HA under verification contains a bug, then A-QED$^2$ ensures detection of that bug during A-QED verification of the corresponding sub-accelerators. Results on over 100 (buggy) versions of a wide variety of HAs with millions of logic gates demonstrate the effectiveness and practicality of A-QED$^2$.

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preprint2016arXiv

CLEAR: Cross-Layer Exploration for Architecting Resilience - Combining Hardware and Software Techniques to Tolerate Soft Errors in Processor Cores

We present a first of its kind framework which overcomes a major challenge in the design of digital systems that are resilient to reliability failures: achieve desired resilience targets at minimal costs (energy, power, execution time, area) by combining resilience techniques across various layers of the system stack (circuit, logic, architecture, software, algorithm). This is also referred to as cross-layer resilience. In this paper, we focus on radiation-induced soft errors in processor cores. We address both single-event upsets (SEUs) and single-event multiple upsets (SEMUs) in terrestrial environments. Our framework automatically and systematically explores the large space of comprehensive resilience techniques and their combinations across various layers of the system stack (586 cross-layer combinations in this paper), derives cost-effective solutions that achieve resilience targets at minimal costs, and provides guidelines for the design of new resilience techniques. We demonstrate the practicality and effectiveness of our framework using two diverse designs: a simple, in-order processor core and a complex, out-of-order processor core. Our results demonstrate that a carefully optimized combination of circuit-level hardening, logic-level parity checking, and micro-architectural recovery provides a highly cost-effective soft error resilience solution for general-purpose processor cores. For example, a 50x improvement in silent data corruption rate is achieved at only 2.1% energy cost for an out-of-order core (6.1% for an in-order core) with no speed impact. However, selective circuit-level hardening alone, guided by a thorough analysis of the effects of soft errors on application benchmarks, provides a cost-effective soft error resilience solution as well (with ~1% additional energy cost for a 50x improvement in silent data corruption rate).

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preprint2015arXiv

Rapid Co-optimization of Processing and Circuit Design to Overcome Carbon Nanotube Variations

Carbon nanotube field-effect transistors (CNFETs) are promising candidates for building energy-efficient digital systems at highly-scaled technology nodes. However, carbon nanotubes (CNTs) are inherently subject to variations that reduce circuit yield, increase susceptibility to noise, and severely degrade their anticipated energy and speed benefits. Joint exploration and optimization of CNT processing options and CNFET circuit design are required to overcome this outstanding challenge. Unfortunately, existing approaches for such exploration and optimization are computationally expensive, and mostly rely on trial-and-error-based ad hoc techniques. In this paper, we present a framework that quickly evaluates the impact of CNT variations on circuit delay and noise margin, and systematically explores the large space of CNT processing options to derive optimized CNT processing and CNFET circuit design guidelines. We demonstrate that our framework: 1) runs over 100x faster than existing approaches, and 2) accurately identifies the most important CNT processing parameters, together with CNFET circuit design parameters (e.g., for CNFET sizing and standard cell layouts), to minimize the impact of CNT variations on CNFET circuit speed with less than 5% energy cost, while simultaneously meeting circuit-level noise margin and yield constraints.

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preprint2015arXiv

TPAD: Hardware Trojan Prevention and Detection for Trusted Integrated Circuits

There are increasing concerns about possible malicious modifications of integrated circuits (ICs) used in critical applications. Such attacks are often referred to as hardware Trojans. While many techniques focus on hardware Trojan detection during IC testing, it is still possible for attacks to go undetected. Using a combination of new design techniques and new memory technologies, we present a new approach that detects a wide variety of hardware Trojans during IC testing and also during system operation in the field. Our approach can also prevent a wide variety of attacks during synthesis, place-and-route, and fabrication of ICs. It can be applied to any digital system, and can be tuned for both traditional and split-manufacturing methods. We demonstrate its applicability for both ASICs and FPGAs. Using fabricated test chips with Trojan emulation capabilities and also using simulations, we demonstrate: 1. The area and power costs of our approach can range between 7.4-165% and 0.07-60%, respectively, depending on the design and the attacks targeted; 2. The speed impact can be minimal (close to 0%); 3. Our approach can detect 99.998% of Trojans (emulated using test chips) that do not require detailed knowledge of the design being attacked; 4. Our approach can prevent 99.98% of specific attacks (simulated) that utilize detailed knowledge of the design being attacked (e.g., through reverse-engineering). 5. Our approach never produces any false positives, i.e., it does not report attacks when the IC operates correctly.

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preprint2015arXiv

Understanding Soft Errors in Uncore Components

The effects of soft errors in processor cores have been widely studied. However, little has been published about soft errors in uncore components, such as memory subsystem and I/O controllers, of a System-on-a-Chip (SoC). In this work, we study how soft errors in uncore components affect system-level behaviors. We have created a new mixed-mode simulation platform that combines simulators at two different levels of abstraction, and achieves 20,000x speedup over RTL-only simulation. Using this platform, we present the first study of the system-level impact of soft errors inside various uncore components of a large-scale, multi-core SoC using the industrial-grade, open-source OpenSPARC T2 SoC design. Our results show that soft errors in uncore components can significantly impact system-level reliability. We also demonstrate that uncore soft errors can create major challenges for traditional system-level checkpoint recovery techniques. To overcome such recovery challenges, we present a new replay recovery technique for uncore components belonging to the memory subsystem. For the L2 cache controller and the DRAM controller components of OpenSPARC T2, our new technique reduces the probability that an application run fails to produce correct results due to soft errors by more than 100x with 3.32% and 6.09% chip-level area and power impact, respectively.

0 citations0 reviewsNo code linkedOpen access