Researcher profile

Serge Meimon

Serge Meimon contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2020arXiv

Optical Incoherence Tomography: a method to generate tomographic retinal cross-sections with non-interferometric imaging systems

Optical tomographic cross-sectional images of biological samples were made possible by interferometric imaging techniques such as Optical Coherence Tomography (OCT). Owing to its unprecedented view of the sample, OCT has become a gold standard, namely for human retinal imaging in the clinical environment. In this Letter, we present Optical Incoherence Tomography (OIT): a completely digital method extending the possibility to generate tomographic retinal cross-sections to non-interferometric imaging systems such as en-face AO-ophthalmoscopes. We demonstrate that OIT can be applied to different imaging modalities using back-scattered and multiply-scattered light including systems without inherent optical sectioning. We show that OIT can be further used to guide focus position when the user is "blind" focusing, allowing precise imaging of translucent retinal structures, the vascular plexuses and the retinal pigment epithelium using respectively split detection, motion contrast, and autofluorescence techniques.

preprint2019arXiv

Jointly super-resolved and optically sectioned Bayesian reconstruction method for structured illumination microscopy

Structured Illumination Microscopy (SIM) is an imaging technique for achieving both super-resolution (SR) and optical sectioning (OS) in wide-field microscopy. It consists in illuminating the sample with periodic patterns at different orientations and positions. The resulting images are then processed to reconstruct the observed object with SR and/or OS. In this work, we present BOSSA-SIM, a general-purpose SIM reconstruction method, applicable to moving objects such as encountered in in vivo retinal imaging, that enables SR and OS jointly in a fully unsupervised Bayesian framework. By modeling a 2-layer object composed of an in-focus layer and a defocused layer, we show that BOSSA-SIM is able to jointly reconstruct them so as to get a super-resolved and optically sectioned in-focus layer. The achieved performance, assessed quantitatively by simulations for several noise levels, compares favorably with a state-of-the-art method. Finally, we validate our method on open-access experimental microscopy data.