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S. Thakur

S. Thakur contributes to research discovery and scholarly infrastructure.

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Published work

4 published item(s)

preprint2021arXiv

Rabi-like splitting and refractive index sensing with hybrid Tamm plasmon-cavity modes

Rabi-like splitting and self-referenced refractive index sensing in hybrid plasmonic-1D photonic crystal structures have been theoretically demonstrated. The coupling between Tamm plasmon and cavity photon modes are tuned by incorporating a low refractive index spacer layer adjacent to the metallic layer to form their hybrid modes. Anticrossing of the modes observed at different values of spacer layer thickness validates the strong coupling between the two modes and causes Rabi-like splitting with different splitting energy. Rabi-like splitting energy decreases with increasing number of periods (N) and refractive index contrast (η) of two dielectric materials used to make the 1D photonic crystals, and the observed variation is explained by an analytical model. Angular and polarization dependency of the hybrid modes shows that the polarization splitting of the lower hybrid mode is much stronger than that of the upper hybrid mode. On further investigation, it is seen that one of the hybrid modes remains unchanged while other mode undergoes significant change with varying the cavity medium. This nature of the hybrid modes has been utilized for designing self-referenced refractive index sensors for sensing different analytes. For η=1.333 and N=10 in a hybrid structure, the sensitivity increases from 51 nm/RIU to 201 nm/RIU with increasing cavity thickness from 170 nm to 892 nm. For the fixed cavity thickness of 892 nm, the sensitivity increases from 201 nm/RIU to 259 nm/RIU by increasing η from 1.333 to 1.605. The sensing parameters such as detection accuracy, quality factor, and figure of merit for two different hybrid structures ([η=1.333, N=10] and [η=1.605, N=6]) have been evaluated and compared. The value of resonant reflectivity of one of the hybrid modes changes considerably with varying analyte medium which can be used for refractive index sensing.

preprint2021arXiv

Simulation studies for source optimization in $^{96}$Zr $β$ decay

The single $β$ decay of $^{96}$Zr to the ground state of $^{96}$Nb is spin forbidden and poses a great experimental challenge. The $β$ decay of $^{96}$Zr can be studied via coincident detection of de-exciting gamma rays in $^{96}$Mo, which is the end product of $^{96}$Nb $β$ decay. Simulations are done with four HPGe detector setup (~33% relative efficiency each) to optimize the source configuration. The results suggest that ~70g of 50% enriched $^{96}$Zr will yield sensitivity comparable to the reported results.

preprint2020arXiv

PRISA: a simple software for determining refractive index, extinction co-efficient, dispersion energy, band gap, and thickness of semiconductor and dielectric thin films

A simple user-friendly software named PRISA has been developed to determine optical constants (refractive index and extinction co-efficient), dispersion parameters (oscillator energy and dispersion energy), absorption co-efficient, band gap and thickness of semiconductor and dielectric thin films from their measured transmission spectrum, only. The thickness, refractive index, and extinction co-efficient of the films have been derived using Envelope method proposed by Swanepoel. The absorption co-efficient in the strong absorption region is calculated using the method proposed by Connel and Lewis. Subsequently, both direct and indirect bandgap of the films is estimated from the absorption co-efficient spectrum using Tauc plot. The codes for the software are written in Python and the graphical user interface is programmed with tkinter package of Python. It provides convenient input and output of the measured and derived data. The software has a feature to retrieve transmission spectrum using the derived parameters in order to check their reliability. The performance of the software is verified by analyzing numerically generated transmission spectra of a-Si:H amorphous semiconductor thin films, and experimentally measured transmission spectra of electron beam evaporated HfO2 dielectric thin films as examples. PRISA is found to be much simpler and accurate as compared to the other freely available softwares. To help other researchers working on thin films, the software is made freely available at https://www.shuvendujena.tk/download.

preprint2014arXiv

Structure related optical properties of electron beam evaporated ZrO2:10%SiO2 thin films

ZrO2:10%SiO2 thinfilms have been deposited on fused silica substrate by reactive electron beam co-evaporation technique at different oxygen partial pressure. The structural analysis shows tetragonal phase with residual tensile stress in the films. The intensity of the tetragonal t(110) phase are found increasing with increasing oxygen pressure. The optical band gap is found increasing from 5.06 eV to 5.28 eV because of increasing crystalinity of monoclinic phase, while the film grain size remains almost constant with increase of oxygen pressure, concludes that the crystallite or grain size has no effect on the optical properties of the films. The dispersion of the refractive index is discussed in terms of single oscillator Wimple-DiDomenico model. The dispersion energy parameter better known as structural order parameter are found increasing with the intensity of t(110) phase. It is observed that films having higher value of order parameter show lower surface roughness which concludes that the local microstructure ordering can predominantly influence the grain morphology which in turn can lead to better surface for higher value of order parameter.