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D. V. Udupa

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2 published item(s)

preprint2021arXiv

Rabi-like splitting and refractive index sensing with hybrid Tamm plasmon-cavity modes

Rabi-like splitting and self-referenced refractive index sensing in hybrid plasmonic-1D photonic crystal structures have been theoretically demonstrated. The coupling between Tamm plasmon and cavity photon modes are tuned by incorporating a low refractive index spacer layer adjacent to the metallic layer to form their hybrid modes. Anticrossing of the modes observed at different values of spacer layer thickness validates the strong coupling between the two modes and causes Rabi-like splitting with different splitting energy. Rabi-like splitting energy decreases with increasing number of periods (N) and refractive index contrast (η) of two dielectric materials used to make the 1D photonic crystals, and the observed variation is explained by an analytical model. Angular and polarization dependency of the hybrid modes shows that the polarization splitting of the lower hybrid mode is much stronger than that of the upper hybrid mode. On further investigation, it is seen that one of the hybrid modes remains unchanged while other mode undergoes significant change with varying the cavity medium. This nature of the hybrid modes has been utilized for designing self-referenced refractive index sensors for sensing different analytes. For η=1.333 and N=10 in a hybrid structure, the sensitivity increases from 51 nm/RIU to 201 nm/RIU with increasing cavity thickness from 170 nm to 892 nm. For the fixed cavity thickness of 892 nm, the sensitivity increases from 201 nm/RIU to 259 nm/RIU by increasing η from 1.333 to 1.605. The sensing parameters such as detection accuracy, quality factor, and figure of merit for two different hybrid structures ([η=1.333, N=10] and [η=1.605, N=6]) have been evaluated and compared. The value of resonant reflectivity of one of the hybrid modes changes considerably with varying analyte medium which can be used for refractive index sensing.

preprint2020arXiv

PRISA: a simple software for determining refractive index, extinction co-efficient, dispersion energy, band gap, and thickness of semiconductor and dielectric thin films

A simple user-friendly software named PRISA has been developed to determine optical constants (refractive index and extinction co-efficient), dispersion parameters (oscillator energy and dispersion energy), absorption co-efficient, band gap and thickness of semiconductor and dielectric thin films from their measured transmission spectrum, only. The thickness, refractive index, and extinction co-efficient of the films have been derived using Envelope method proposed by Swanepoel. The absorption co-efficient in the strong absorption region is calculated using the method proposed by Connel and Lewis. Subsequently, both direct and indirect bandgap of the films is estimated from the absorption co-efficient spectrum using Tauc plot. The codes for the software are written in Python and the graphical user interface is programmed with tkinter package of Python. It provides convenient input and output of the measured and derived data. The software has a feature to retrieve transmission spectrum using the derived parameters in order to check their reliability. The performance of the software is verified by analyzing numerically generated transmission spectra of a-Si:H amorphous semiconductor thin films, and experimentally measured transmission spectra of electron beam evaporated HfO2 dielectric thin films as examples. PRISA is found to be much simpler and accurate as compared to the other freely available softwares. To help other researchers working on thin films, the software is made freely available at https://www.shuvendujena.tk/download.