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Rick J. Meijerink

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Published work

2 published item(s)

preprint2016arXiv

98% directional guiding of spin currents with 90 micrometer relaxation length in bilayer graphene using carrier drift

Electrical control of spin signals and long distance spin transport are major requirements in the field of spin electronics. Here we report the efficient guiding of spin currents at room temperature in high mobility hexagonal boron nitride encapsulated bilayer graphene using carrier drift. Our experiments, together with modelling, show that the spin relaxation length can be tuned from 2 to 88 micrometers when applying a DC current of $\mp$40 uA respectively. Our model predicts that, extending the range up to $\mathrm{I_{dc}}=\mp$150 uA, the spin relaxation length can be tuned from 0.6 to 320 um respectively, indicating that spin relaxation lengths in the millimeter range are within scope in near future with moderate current densities. Our results also show that we are able to direct spin currents on either side of a spin injection contact. 98% of the injected spins flow to the left when $\mathrm{I_{dc}}$= -40 uA and 65% flow to the right when the drift current is reversed. Our model shows that, for $\mathrm{I_{dc}}=\mp$150 uA the numbers reach 99.8% and 95% respectively showing the potential of carrier drift for spin-based logic operations and devices.

preprint2015arXiv

24 \textmu m length spin relaxation length in boron nitride encapsulated bilayer graphene

We have performed spin and charge transport measurements in dual gated high mobility bilayer graphene encapsulated in hexagonal boron nitride. Our results show spin relaxation lengths $λ_s$ up to 13~\textmu m at room temperature with relaxation times $τ_s$ of 2.5~ns. At 4~K, the diffusion coefficient rises up to 0.52~m$^2$/s, a value 5 times higher than the best achieved for graphene spin valves up to date. As a consequence, $λ_s$ rises up to 24~\textmu m with $τ_s$ as high as 2.9~ns. We characterized 3 different samples and observed that the spin relaxation times increase with the device length. We explain our results using a model that accounts for the spin relaxation induced by the non-encapsulated outer regions.