Source author record

Patrice Bertail

Patrice Bertail appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record

Catalog footprint

What is connected

3works
3topics
4close collaborators

Actions

Connect this record

Log in to claim

Research graph

See the researcher in context

Open full explorer

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

3 published item(s)

preprint2016arXiv

Practical targeted learning from large data sets by survey sampling

We address the practical construction of asymptotic confidence intervals for smooth (i.e., path-wise differentiable), real-valued statistical parameters by targeted learning from independent and identically distributed data in contexts where sample size is so large that it poses computational challenges. We observe some summary measure of all data and select a sub-sample from the complete data set by Poisson rejective sampling with unequal inclusion probabilities based on the summary measures. Targeted learning is carried out from the easier to handle sub-sample. We derive a central limit theorem for the targeted minimum loss estimator (TMLE) which enables the construction of the confidence intervals. The inclusion probabilities can be optimized to reduce the asymptotic variance of the TMLE. We illustrate the procedure with two examples where the parameters of interest are variable importance measures of an exposure (binary or continuous) on an outcome. We also conduct a simulation study and comment on its results. keywords: semiparametric inference; survey sampling; targeted minimum loss estimation (TMLE)

preprint2016arXiv

Sharp exponential inequalities in survey sampling: conditional Poisson sampling schemes

This paper is devoted to establishing exponential bounds for the probabilities of deviation of a sample sum from its expectation, when the variables involved in the summation are obtained by sampling in a finite population according to a rejective scheme, generalizing sampling without replacement, and by using an appropriate normalization. In contrast to Poisson sampling, classical deviation inequalities in the i.i.d. setting do not straightforwardly apply to sample sums related to rejective schemes, due to the inherent dependence structure of the sampled points. We show here how to overcome this difficulty, by combining the formulation of rejective sampling as Poisson sampling conditioned upon the sample size with the Escher transformation. In particular, the Bennett/Bernstein type bounds established highlight the effect of the asymptotic variance of the (properly standardized) sample weighted sum and are shown to be much more accurate than those based on the negative association property shared by the terms involved in the summation. Beyond its interest in itself, such a result for rejective sampling is crucial, insofar as it can be extended to many other sampling schemes, namely those that can be accurately approximated by rejective plans in the sense of the total variation distance.

preprint2015arXiv

Survey schemes for stochastic gradient descent with applications to M-estimation

In certain situations that shall be undoubtedly more and more common in the Big Data era, the datasets available are so massive that computing statistics over the full sample is hardly feasible, if not unfeasible. A natural approach in this context consists in using survey schemes and substituting the "full data" statistics with their counterparts based on the resulting random samples, of manageable size. It is the main purpose of this paper to investigate the impact of survey sampling with unequal inclusion probabilities on stochastic gradient descent-based M-estimation methods in large-scale statistical and machine-learning problems. Precisely, we prove that, in presence of some a priori information, one may significantly increase asymptotic accuracy when choosing appropriate first order inclusion probabilities, without affecting complexity. These striking results are described here by limit theorems and are also illustrated by numerical experiments.