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Researcher profile

Myung-Ho Bae

Myung-Ho Bae contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
cond-mat.mes-hallcond-mat.mtrl-scicond-mat.supr-con

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Published work

9 published item(s)

preprint2019arXiv

Energy dissipation in van der Waals two-dimensional devices

Understanding the physics underlying energy dissipation is necessary for the effective thermal management of devices based on two-dimensional (2D) materials and requires insights into the interplay between heat generation and diffusion in such materials. We review the microscopic mechanisms that govern Joule heating and energy dissipation processes in 2D materials such as graphene, black phosphorus and semiconducting transition metal dichalcogenides. We discuss the processes through which non-equilibrium charge carriers, created either transiently through photoexcitation or at steady state by a large electric field, undergo energy relaxation with the lattice and the substrate We also discuss how these energy dissipation processes are affected by the device configuration (heterostructure, substrate material including hexagonal boron nitride, etc) as the use of different substrates, encapsulation, disorder, etc can introduce or remove scattering processes that change the energy relaxation pathways. Finally, we discuss how the unique carrier scattering dynamics in graphene-based vdW heterostructures can be exploited for optoelectronic applications in light emission and photodetection.

0 citations0 reviewsNo code linkedOpen access
preprint2012arXiv

Role of Joule Heating on Current Saturation and Transient Behavior of Graphene Transistors

We use simulations to examine current saturation in sub-micron graphene transistors on SiO2/Si. We find self-heating is partly responsible for current saturation (lower output conductance), but degrades current densities >1 mA/um by up to 15%. Heating effects are reduced if the supporting insulator is thinned, or in shorter channel devices by partial heat sinking at the contacts. The transient behavior of such devices has thermal time constants of ~30-300 ns, dominated by the thickness of the supporting insulator and that of device capping layers (a behavior also expected in ultrathin body SOI transistors). The results shed important physical insight into the high-field and transient behavior of graphene transistors.

0 citations0 reviewsNo code linkedOpen access
preprint2012arXiv

Transport Measurement of Andreev Bound States in a Kondo-Correlated Quantum Dot

We report transport measurements of gate-tunable Andreev bound states in a carbon nanotube quantum dot coupled to two superconducting leads. In particular, we observe clear features of two types of Kondo ridges, which can be understood in terms of the interplay between the Kondo effect and superconductivity. In the first type (type I), the coupling is strong and the Kondo effect is dominant. Levels of the Andreev bound states display anti-crossing in the middle of the ridge. On the other hand, crossing of the two Andreev bound states is shown in the second type (type II) together with the 0-$π$ transition of the Josephson junction. Our scenario is well understood in terms of only a single dimensionless parameter, $k_BT_K^{min}/Δ$, where $T_K^{min}$ and $Δ$ are the minimum Kondo temperature of a ridge and the superconducting order parameter, respectively. Our observation is consistent with measurements of the critical current, and is supported by numerical renormalization group calculations.

0 citations0 reviewsNo code linkedOpen access
preprint2011arXiv

Microwave Enhancement of Phase Slip Rate in Quasi One-Dimensional Superconducting Nanowires

We study current-voltage (V-I) characteristics of short superconducting nanowires of length ~ 100 nm exposed to microwave radiation of frequencies between 100 MHz and 15 GHz. The radiation causes a decrease of the average switching current of the wire. This suppression of the switching current is modeled assuming that there is one-to-one correspondence between Little's phase slips and the experimentally observed switching events. At some critical power P* of the radiation a dissipative dynamic superconducting state occurs as an extra step on the V-I curve. It is identified as a phase slip center (PSC). With the dependence of the switching currents and the standard deviations observed at the transitions (i) from a constant supercurrent state to a normal state and (ii) from a constant superconducting state to a PSC state, we conclude that both of the two types of the switching events are triggered by the same microscopic event, namely a single Little's phase slip. We show that the Skocpol-Beasely-Tinkham model is not applicable to our microwave-driven phase slip centers, since it leads to an unphysical small estimated value of the size of the dissipative core of the PSC. Through the analysis of the witching current distributions at a sufficiently low temperature, we also present evidence that the quantum phase slip play a role in switching events under microwaves.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Heat Conduction across Monolayer and Few-Layer Graphenes

We report the thermal conductance G of Au/Ti/graphene/SiO2 interfaces (graphene layers 1 < n < 10) typical of graphene transistor contacts. We find G ~ 25 MW m-2 K-1 at room temperature, four times smaller than the thermal conductance of a Au/Ti/SiO2 interface, even when n = 1. We attribute this reduction to the thermal resistance of Au/Ti/graphene and graphene/SiO2 interfaces acting in series. The temperature dependence of G from 50 < T < 500 K also indicates that heat is predominantly carried by phonons through these interfaces. Our findings indicate that metal contacts can limit not only electrical transport, but also thermal dissipation from sub-micron graphene devices.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Imaging, simulation, and electrostatic control of power dissipation in graphene devices

We directly image hot spot formation in functioning mono- and bilayer graphene field effect transistors (GFETs) using infrared thermal microscopy. Correlating with an electrical-thermal transport model provides insight into carrier distributions, fields, and GFET power dissipation. The hot spot corresponds to the location of minimum charge density along the GFET; by changing the applied bias this can be shifted between electrodes or held in the middle of the channel in ambipolar transport. Interestingly, the hot spot shape bears the imprint of the density of states in mono- vs. bilayer graphene. More broadly, we find that thermal imaging combined with self-consistent simulation provides a non-invasive approach for more deeply examining transport and energy dissipation in nanoscale devices.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Mobility and Saturation Velocity in Graphene on SiO2

We examine mobility and saturation velocity in graphene on SiO2 above room temperature (300-500 K) and at high fields (~1 V/um). Data are analyzed with practical models including gated carriers, thermal generation, &#34;puddle&#34; charge, and Joule heating. Both mobility and saturation velocity decrease with rising temperature above 300 K, and with rising carrier density above 2x10^12 cm^-2. Saturation velocity is >3x10^7 cm/s at low carrier density, and remains greater than in Si up to 1.2x10^13 cm^-2. Transport appears primarily limited by the SiO2 substrate, but results suggest intrinsic graphene saturation velocity could be more than twice that observed here.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Negative and Positive Magnetoresistance in Bilayer Graphene: Effects of Weak Localization and Charge Inhomogeneity

We report measurements of magnetoresistance in bilayer graphene as a function of gate voltage (carrier density) and temperature. We examine multiple contributions to the magnetoresistance, including those of weak localization (WL), universal conductance fluctuations (UCF), and inhomogeneous charge transport. A clear WL signal is evident at all measured gate voltages (in the hole doped regime) and temperature ranges (from 0.25 K to 4.3 K), and the phase coherence length extracted from WL data does not saturate at low temperatures. The WL data is fit to demonstrate that electron-electron Nyquist scattering is the major source of phase decoherence. A decrease in UCF amplitude with increasing gate voltage and temperature is shown to be consistent with a corresponding decrease in the phase coherence length. In addition, a weak positive magnetoresistance at higher magnetic fields is observed, and attributed to inhomogeneous charge transport.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Reliably Counting Atomic Planes of Few-Layer Graphene (n>4)

We demonstrate a reliable technique for counting atomic planes (n) of few-layer graphene (FLG) on SiO2/Si substrates by Raman spectroscopy. Our approach is based on measuring the ratio of the integrated intensity of the G graphene peak and the optical phonon peak of Si, I(G)/I(Si), and is particularly useful in the range n>4 where few methods exist. We compare our results with atomic force microscopy (AFM) measurements and Fresnel equation calculations. Lastly, we apply our method to unambiguously identify n of FLG devices and find that the mobility (~2000 cm2 V-1 s-1) is independent of layer thickness for n>4.

0 citations0 reviewsNo code linkedOpen access