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Mehdi B. tahoori

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4 publications

preprint2024arXiv

Concurrent Self-testing of Neural Networks Using Uncertainty Fingerprint

Neural networks (NNs) are increasingly used in always-on safety-critical applications deployed on hardware accelerators (NN-HAs) employing various memory technologies. Reliable continuous operation of NN is essential for safety-critical applications. During online operation, NNs are susceptible to single and multiple permanent and soft errors due to factors such as radiation, aging, and thermal effects. Explicit NN-HA testing methods cannot detect transient faults during inference, are unsuitable for always-on applications, and require extensive test vector generation and storage. Therefore, in this paper, we propose the \emph{uncertainty fingerprint} approach representing the online fault status of NN. Furthermore, we propose a dual head NN topology specifically designed to produce uncertainty fingerprints and the primary prediction of the NN in \emph{a single shot}. During the online operation, by matching the uncertainty fingerprint, we can concurrently self-test NNs with up to 100%100\% coverage with a low false positive rate while maintaining a similar performance of the primary task. Compared to existing works, memory overhead is reduced by up to 243.7243.7 MB, multiply and accumulate (MAC) operation is reduced by up to 10000×10000\times, and false-positive rates are reduced by up to 89%89\%.

preprint2022arXiv

Approximate Decision Trees For Machine Learning Classification on Tiny Printed Circuits

Although Printed Electronics (PE) cannot compete with silicon-based systems in conventional evaluation metrics, e.g., integration density, area and performance, PE offers attractive properties such as on-demand ultra-low-cost fabrication, flexibility and non-toxicity. As a result, it targets application domains that are untouchable by lithography-based silicon electronics and thus have not yet seen much proliferation of computing. However, despite the attractive characteristics of PE, the large feature sizes in PE prohibit the realization of complex printed circuits, such as Machine Learning (ML) classifiers. In this work, we exploit the hardware-friendly nature of Decision Trees for machine learning classification and leverage the hardware-efficiency of the approximate design in order to generate approximate ML classifiers that are suitable for tiny, ultra-resource constrained, and battery-powered printed applications.

preprint2014arXiv

Towards Cross-layer Reliability Analysis of Transient and Permanent Faults

Due to the increasing complexity of Multi-Processor Systems on Chip (MPSoCs), system-level design methodologies have got a lot of attention in recent years. However, the significant gap between the system-level reliability analysis and the level where the actual faults occur necessitates a cross-layer approach in which the sufficient data about the effects of faults at low levels are passed to the system level. So far, the cross-layer reliability analysis techniques focus on a specific type of faults, e.g., either permanent or transient faults. In this work, we aim at proposing a cross-layer reliability analysis which considers different fault types concurrently and connects reliability analysis techniques at different levels of abstraction using adapters.

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