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Researcher profile

Jeffrey M. Ede

Jeffrey M. Ede contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
eess.IVMachine LearningComputer Visioncond-mat.mtrl-sciphysics.data-an

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Published work

6 published item(s)

preprint2021arXiv

Review: Deep Learning in Electron Microscopy

Deep learning is transforming most areas of science and technology, including electron microscopy. This review paper offers a practical perspective aimed at developers with limited familiarity. For context, we review popular applications of deep learning in electron microscopy. Afterwards, we discuss hardware and software needed to get started with deep learning and interface with electron microscopes. We then review neural network components, popular architectures, and their optimization. Finally, we discuss future directions of deep learning in electron microscopy.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Exit Wavefunction Reconstruction from Single Transmission Electron Micrographs with Deep Learning

Half of wavefunction information is undetected by conventional transmission electron microscopy (CTEM) as only the intensity, and not the phase, of an image is recorded. Following successful applications of deep learning to optical hologram phase recovery, we have developed neural networks to recover phases from CTEM intensities for new datasets containing 98340 exit wavefunctions. Wavefunctions were simulated with clTEM multislice propagation for 12789 materials from the Crystallography Open Database. Our networks can recover 224x224 wavefunctions in ~25 ms for a large range of physical hyperparameters and materials, and we demonstrate that performance improves as the distribution of wavefunctions is restricted. Phase recovery with deep learning overcomes the limitations of traditional methods: it is live, not susceptible to distortions, does not require microscope modification or multiple images, and can be applied to any imaging regime. This paper introduces multiple approaches to CTEM phase recovery with deep learning, and is intended to establish starting points to be improved upon by future research. Source code and links to our new datasets and pre-trained models are available at https://github.com/Jeffrey-Ede/one-shot

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Partial Scanning Transmission Electron Microscopy with Deep Learning

Compressed sensing algorithms are used to decrease electron microscope scan time and electron beam exposure with minimal information loss. Following successful applications of deep learning to compressed sensing, we have developed a two-stage multiscale generative adversarial neural network to complete realistic 512$\times$512 scanning transmission electron micrographs from spiral, jittered gridlike, and other partial scans. For spiral scans and mean squared error based pre-training, this enables electron beam coverage to be decreased by 17.9$\times$ with a 3.8\% test set root mean squared intensity error, and by 87.0$\times$ with a 6.2\% error. Our generator networks are trained on partial scans created from a new dataset of 16227 scanning transmission electron micrographs. High performance is achieved with adaptive learning rate clipping of loss spikes and an auxiliary trainer network. Our source code, new dataset, and pre-trained models have been made publicly available at https://github.com/Jeffrey-Ede/partial-STEM

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Warwick Electron Microscopy Datasets

Large, carefully partitioned datasets are essential to train neural networks and standardize performance benchmarks. As a result, we have set up new repositories to make our electron microscopy datasets available to the wider community. There are three main datasets containing 19769 scanning transmission electron micrographs, 17266 transmission electron micrographs, and 98340 simulated exit wavefunctions, and multiple variants of each dataset for different applications. To visualize image datasets, we trained variational autoencoders to encode data as 64-dimensional multivariate normal distributions, which we cluster in two dimensions by t-distributed stochastic neighbor embedding. In addition, we have improved dataset visualization with variational autoencoders by introducing encoding normalization and regularization, adding an image gradient loss, and extending t-distributed stochastic neighbor embedding to account for encoded standard deviations. Our datasets, source code, pretrained models, and interactive visualizations are openly available at https://github.com/Jeffrey-Ede/datasets.

0 citations0 reviewsNo code linkedOpen access
preprint2019arXiv

Adaptive Learning Rate Clipping Stabilizes Learning

Artificial neural network training with stochastic gradient descent can be destabilized by "bad batches" with high losses. This is often problematic for training with small batch sizes, high order loss functions or unstably high learning rates. To stabilize learning, we have developed adaptive learning rate clipping (ALRC) to limit backpropagated losses to a number of standard deviations above their running means. ALRC is designed to complement existing learning algorithms: Our algorithm is computationally inexpensive, can be applied to any loss function or batch size, is robust to hyperparameter choices and does not affect backpropagated gradient distributions. Experiments with CIFAR-10 supersampling show that ALCR decreases errors for unstable mean quartic error training while stable mean squared error training is unaffected. We also show that ALRC decreases unstable mean squared errors for partial scanning transmission electron micrograph completion. Our source code is publicly available at https://github.com/Jeffrey-Ede/ALRC

0 citations0 reviewsNo code linkedOpen access
preprint2018arXiv

Improving Electron Micrograph Signal-to-Noise with an Atrous Convolutional Encoder-Decoder

We present an atrous convolutional encoder-decoder trained to denoise 512$\times$512 crops from electron micrographs. It consists of a modified Xception backbone, atrous convoltional spatial pyramid pooling module and a multi-stage decoder. Our neural network was trained end-to-end to remove Poisson noise applied to low-dose ($\ll$ 300 counts ppx) micrographs created from a new dataset of 17267 2048$\times$2048 high-dose ($>$ 2500 counts ppx) micrographs and then fine-tuned for ordinary doses (200-2500 counts ppx). Its performance is benchmarked against bilateral, non-local means, total variation, wavelet, Wiener and other restoration methods with their default parameters. Our network outperforms their best mean squared error and structural similarity index performances by 24.6% and 9.6% for low doses and by 43.7% and 5.5% for ordinary doses. In both cases, our network's mean squared error has the lowest variance. Source code and links to our new high-quality dataset and trained network have been made publicly available at https://github.com/Jeffrey-Ede/Electron-Micrograph-Denoiser

0 citations0 reviewsNo code linkedOpen access