Researcher profile

Jean-Michel André

Jean-Michel André contributes to research discovery and scholarly infrastructure.

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Published work

8 published item(s)

preprint2015arXiv

Interface observation of heat-treated Co/Mo2C multilayers

We study the interface evolution of a series of periodic Co/Mo2C multilayers as a function of the annealing temperature up to 600{\textdegree}C. Different complementary techniques are implemented to get information on the phenomenon taking place at the interfaces of the stack. The periodical structure of Co/Mo2C multilayer is proven by Time-of-flight secondary ion mass spectrometry (ToF-SIMS) depth profiles which demonstrate the formation of an oxide layer at both air/stack and stack/substrate interfaces. From Nuclear magnetic resonance (NMR) spectra, we observed the intermixing phenomenon of Co and C atoms for the as-deposited sample, and then at annealing temperature above 300{\textdegree}C Co and C atoms separate from their mixed regions. Comparison of NMR results between Co/Mo 2 C and Co/C references confirms this phenomenon. This is in agreement with x-ray emission spectroscopy (XES) measurements. Furthermore the calculation of the Co-C, Co-Mo and Mo-C mixing enthalpy using Miedema's model gives a proof of the demixing of Co and C atoms present within the stacks above 300{\textdegree}C. From the transmission electron microscopy (TEM) analysis, we found the presence of some crystallites within the as-deposited sample as well as the mainly amorphous nature of all layers. This is confirmed using x-ray diffraction (XRD) patterns which also demonstrate the growth of crystallites induced upon annealing.

preprint2014arXiv

Feasibility considerations of a soft-x-ray distributed feedback laser pumped by an x-ray free electron laser

We discuss the feasibility of a soft-x-ray distributed feedback laser (DFL) pumped by an x-ray free electron laser (X-FEL). The DFL under consideration is a Mg/SiC bi-layered Bragg reflector pumped by a single X-FEL bunch at 57.4 eV, stimulating the Mg L2,3 emission at 49 eV corresponding to the 3s-3d -> 2p1/2,3/2 transition. Based on a model developed by Yariv and Yeh and an extended coupled-wave theory, we show that it would be possible to obtain a threshold gain compatible with the pumping provided by available X-FEL facilities.

preprint2013arXiv

Determination of the magnetization profile of Co/Mg periodic multilayers by magneto-optic Kerr effect and X-ray magnetic resonant reflectivity

The resonant magnetic reflectivity of Co/Mg multilayers around the Co L2,3 absorption edge is simulated then measured on a specifically designed sample. The dichroic signal is obtained when making the difference between the two reflectivities measured with the magnetic field applied in two opposite directions parallel to the sample surface. The simulations show that the existence of magnetic dead layers at the interfaces between the Co and Mg layers leads to an important increase of the dichroic signal measured in the vicinity of the third Bragg peak that otherwise should be negligible. The measurements are in agreement with the model introducing 0.25 nm thick dead layers. This is attributed to the Co atoms in contact with the Mg layers and thus we conclude that the Co-Mg interfaces are abrupt from the magnetic point of view.

preprint2013arXiv

High-resolution x-ray analysis with multilayer gratings

Periodic multilayers are nowadays widely used to perform x-ray analysis in the soft x-ray range (photon energy lower than 1 keV). However, they do not permit to obtain high-resolution spectra like natural or synthetic crystals. Thus, multilayers cannot resolve interferences between close x-ray lines. It has been shown and demonstrated experimentally that patterning a grating profile within a multilayer structure leads to a diffractive optics with improved resolving power. We illustrate the use of a Mo/B4C multilayer grating in the Fe L and C K spectral ranges, around 700 eV and 280 eV respectively. First, in the Fe L range, the improved spectral resolution enables us to distinguish the Fe Lαand Lβemissions (separated by 13 eV). In addition, using a sample made of a mix of LiF and an iron ore, we show that it is possible to easily resolve the F K and Fe L emissions. These examples demonstrate that an improved x-ray analysis can be obtained with multilayer gratings when there is the need to study samples having elements giving rise to close emission lines. Second, in the C K range, by comparing C Kαspectra from B4C and cellulose, we show that the shape of the emission band is sensitive to the chemical state of the carbon atom.

preprint2013arXiv

Oscillating dipole model for the X-ray standing wave enhanced fluorescence in periodic multilayers

Periodic multilayers give rise to enhanced X-ray fluorescence when a regime of standing waves occurs within the structure. This regime may concern the primary radiation used to induce the fluorescence, the secondary radiation of fluorescence or both of them. Until now, existing models only dealt with standing wave regime of primary radiation. We present a theoretical approach based on the oscillating dipole model and the coupled-wave theory that can treat efficiently any standing wave regime. We compare our simulations to experimental data available in the literature.

preprint2012arXiv

An etched multilayer as a dispersive element in a curved-crystal spectrometer: implementation and performance

Etched multilayers obtained by forming a laminar grating pattern within interferential multilayer mirrors are used in the soft x-ray range to improve the spectral resolution of wavelength dispersive spectrometers equipped with periodic multilayers. We describe the fabrication process of such an etched multilayer dispersive element, its characterization through reflectivity measurement and simulations, and its implementation in a high-resolution Johann-type spectrometer. The specially designed patterning of a Mo/B4C multilayer is found fruitful in the range of the C K emission as the diffraction pattern narrows by a factor 4 with respect to the non-etched structure. This dispersive element with an improved spectral resolution was successfully implemented for electronic structure study with an improved spectral resolution by x-ray emission spectroscopy. As first results we present the distinction between the chemical states of carbon atoms in various compounds, such as graphite, SiC and B4C, by the different shape of their C K emission band.

preprint2012arXiv

Analysis of periodic Mo/Si multilayers: influence of the Mo thickness

A set of Mo/Si periodic multilayers is studied by non destructive analysis methods. The thickness of the Si layers is 5 nm while the thickness of the Mo layers changes from one multilayer to another, from 2 to 4 nm. This enables us to probe the effect of the transition between the amorphous to crystalline state of the Mo layers near the interfaces with Si on the optical performances of the multilayers. This transition results in the variation of the refractive index (density variation) of the Mo layers, as observed by x-ray reflectivity (XRR) at a wavelength of 0.154 nm. Combining x-ray emission spectroscopy and XRR, the parameters (composition, thickness and roughness) of the interfacial layers formed by the interaction between the Mo and Si layers are determined. However, these parameters do not evolve significantly as a function of the Mo thickness. It is observed by diffuse scattering at 1.33 nm that the lateral correlation length of the roughness strongly decreases when the Mo thickness goes from 2 to 3 nm. This is due to the development of Mo crystallites parallel to the multilayer surface.

preprint2012arXiv

Investigation of the thermal stability of Mg/Co periodic multilayers for EUV applications

We present the results of the characterization of Mg/Co periodic multilayers and their thermal stability for the EUV range. The annealing study is performed up to a temperature of 400\degree C. Images obtained by scanning transmission electron microscopy and electron energy loss spectroscopy clearly show the good quality of the multilayer structure. The measurements of the EUV reflectivity around 25 nm (~49 eV) indicate that the reflectivity decreases when the annealing temperature increases above 300\degreeC. X-ray emission spectroscopy is performed to determine the chemical state of the Mg atoms within the Mg/Co multilayer. Nuclear magnetic resonance used to determine the chemical state of the Co atoms and scanning electron microscopy images of cross sections of the Mg/Co multilayers reveal changes in the morphology of the stack from an annealing temperature of 305\degreee;C. This explains the observed reflectivity loss.