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S. Nannarone

S. Nannarone contributes to research discovery and scholarly infrastructure.

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Published work

7 published item(s)

preprint2013arXiv

Determination of the magnetization profile of Co/Mg periodic multilayers by magneto-optic Kerr effect and X-ray magnetic resonant reflectivity

The resonant magnetic reflectivity of Co/Mg multilayers around the Co L2,3 absorption edge is simulated then measured on a specifically designed sample. The dichroic signal is obtained when making the difference between the two reflectivities measured with the magnetic field applied in two opposite directions parallel to the sample surface. The simulations show that the existence of magnetic dead layers at the interfaces between the Co and Mg layers leads to an important increase of the dichroic signal measured in the vicinity of the third Bragg peak that otherwise should be negligible. The measurements are in agreement with the model introducing 0.25 nm thick dead layers. This is attributed to the Co atoms in contact with the Mg layers and thus we conclude that the Co-Mg interfaces are abrupt from the magnetic point of view.

preprint2012arXiv

Analysis of periodic Mo/Si multilayers: influence of the Mo thickness

A set of Mo/Si periodic multilayers is studied by non destructive analysis methods. The thickness of the Si layers is 5 nm while the thickness of the Mo layers changes from one multilayer to another, from 2 to 4 nm. This enables us to probe the effect of the transition between the amorphous to crystalline state of the Mo layers near the interfaces with Si on the optical performances of the multilayers. This transition results in the variation of the refractive index (density variation) of the Mo layers, as observed by x-ray reflectivity (XRR) at a wavelength of 0.154 nm. Combining x-ray emission spectroscopy and XRR, the parameters (composition, thickness and roughness) of the interfacial layers formed by the interaction between the Mo and Si layers are determined. However, these parameters do not evolve significantly as a function of the Mo thickness. It is observed by diffuse scattering at 1.33 nm that the lateral correlation length of the roughness strongly decreases when the Mo thickness goes from 2 to 3 nm. This is due to the development of Mo crystallites parallel to the multilayer surface.

preprint2012arXiv

Investigation of the thermal stability of Mg/Co periodic multilayers for EUV applications

We present the results of the characterization of Mg/Co periodic multilayers and their thermal stability for the EUV range. The annealing study is performed up to a temperature of 400\degree C. Images obtained by scanning transmission electron microscopy and electron energy loss spectroscopy clearly show the good quality of the multilayer structure. The measurements of the EUV reflectivity around 25 nm (~49 eV) indicate that the reflectivity decreases when the annealing temperature increases above 300\degreeC. X-ray emission spectroscopy is performed to determine the chemical state of the Mg atoms within the Mg/Co multilayer. Nuclear magnetic resonance used to determine the chemical state of the Co atoms and scanning electron microscopy images of cross sections of the Mg/Co multilayers reveal changes in the morphology of the stack from an annealing temperature of 305\degreee;C. This explains the observed reflectivity loss.

preprint2011arXiv

Introduction of Zr in nanometric periodic Mg/Co multilayers

We study the introduction of a third material, namely Zr, within a nanometric periodic Mg/Co structure designed to work as optical component in the extreme UV (EUV) spectral range. Mg/Co, Mg/Zr/Co, Mg/Co/Zr and Mg/Zr/Co/Zr multilayers are designed, then characterized in terms of structural quality and optical performances through X-ray and EUV reflectometry measurements respectively. For the Mg/Co/Zr structure, the reflectance value is equal to 50% at 25.1 nm and 45deg of grazing incidence and reaches 51.3% upon annealing at 200deg C. Measured EUV reflectivity values of tri-layered systems are discussed in terms of material order within a period and compared to the predictions of the theoretical model of Larruquert. Possible applications are pointed out.

preprint2011arXiv

On the Kramers-Kronig transform with logarithmic kernel for the reflection phase in the Drude model

We use the Kramers-Kronig transform (KKT) with logarithmic kernel to obtain the reflection phase and, subsequently, the complex refractive index of a bulk mirror from reflectance. However, there remains some confusion regarding the formulation for this analysis. Assuming the damped Drude model for the dielectric constant and the oblique incidence case, we calculate the additional terms: phase at zero frequency and Blashke factor and we propose a reformulated KKT within this model. Absolute reflectance in the s-polarization case of a gold film is measured between 40 and 350 eV for various glancing angles using synchrotron radiation and its complex refractive index is deduced using the reformulated KKT that we propose. The results are discussed with respect to the data available in the literature.

preprint2009arXiv

GaAs(111)A and B in hydrazine sulfide solutions : extreme polarity dependence of surface adsorption processes

Chemical bonds formed by hydrazine-sulfide treatment of GaAs(111) were studied by synchrotron photoemission spectroscopy. At the B surface, the top arsenic atoms are replaced by nitrogen atoms, while GaAs(111)A is covered by sulfur, also bonded to underlying gallium, despite the sulfide molar concentration being 103 times smaller than that of the hydrazine. This extreme dependence on surface polarity is explained by competitive adsorption processes of HS- and OH- anions and of hydrazine molecules, on Ga- adsorption sites, which have distinct configurations on the A and B surfaces.

preprint2009arXiv

Measuring magnetic profiles at manganite surfaces with monolayer resolution

The performance of manganite-based magnetic tunnel junctions (MTJs) has suffered from reduced magnetization present at the junction interfaces that is ultimately responsible for the spin polarization of injected currents; this behavior has been attributed to a magnetic "dead layer" that typically extends a few unit cells into the manganite. X-ray magnetic scattering in resonant conditions (XRMS) is one of the most innovative and effective techniques to extract surface or interfacial magnetization profiles with subnanometer resolution, and has only recently been applied to oxide heterostructures. Here we present our approach to characterizing the surface and interfacial magnetization of such heterostructures using the XRMS technique, conducted at the BEAR beamline (Elettra synchrotron, Trieste). Measurements were carried out in specular reflectivity geometry, switching the left/right elliptical polarization of light as well the magnetization direction in the scattering plane. Spectra were collected across the Mn L2,3 edge for at least four different grazing angles in order to better analyse the interference phenomena. The resulting reflectivity spectra have been carefully fit to obtain the magnetization profiles, minimizing the number of free parameters as much as possible. Optical constants of the samples (real and imaginary part of the refractive index) in the interested frequency range are obtained through absorption measurements in two magnetization states and subsequent Kramers-Kronig transformation, allowing quantitative fits of the magnetization profile at different temperatures. We apply this method to the study of air-exposed surfaces of epitaxial La2/3Sr1/3MnO3 (001) films grown on SrTiO3 (001) substrates.