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Huanhuan Fan

Huanhuan Fan appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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2 published item(s)

preprint2020arXiv

Visual Localization Using Semantic Segmentation and Depth Prediction

In this paper, we propose a monocular visual localization pipeline leveraging semantic and depth cues. We apply semantic consistency evaluation to rank the image retrieval results and a practical clustering technique to reject estimation outliers. In addition, we demonstrate a substantial performance boost achieved with a combination of multiple feature extractors. Furthermore, by using depth prediction with a deep neural network, we show that a significant amount of falsely matched keypoints are identified and eliminated. The proposed pipeline outperforms most of the existing approaches at the Long-Term Visual Localization benchmark 2020.

preprint2015arXiv

TOT Measurement Implemented in FPGA TDC

Time measurement plays a crucial rule for the purpose of particle identification in high energy physical experiments. With the upgrading of physical goal and the developing of electronics, modern time measurement system meets the requirement of excellent resolution specification as well as high integrity. Due to Field Programmable Gate Array (FPGA), FPGA time-to-digital converter (TDC) becomes one of mature and prominent time measurement methods in recent years. For correcting time-walk effect caused by leading timing, time-over-threshold (TOT) measurement should be added in the FPGA TDC. TOT can be obtained by measuring the interval time of signal leading and trailing edge. Unfortunately, a traditional TDC can recognize only one kind of signal edge, the leading or the trailing. Generally, to measure the interval, two TDC channels can be used at the same time, one for leading, the other for trailing. However, this method will increase the amount of used FPGA resource and reduce the TDC's integrity unavoidably. This paper presents one method of TOT measurement implemented in a Xilinx Virtex-5 FPGA. In this method, TOT measure can be achieved in only one TDC input channel. The consumed resources and time resolution can both be guaranteed. Test shows that this TDC can achieve resolution better than 15 ps for leading edge measurement and 37 ps for TOT measurement. Furthermore, the TDC measuring dead time is about 2 clock cycles, which makes it be good for applications of higher physical event rate