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Gregory Prigozhin

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astro-ph astro-ph.HE astro-ph.IM hep-ex physics.ins-det

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preprint2022arXiv

Development and characterization of a fast and low noise readout for the next generation X-ray CCDs

The broad energy response, low electronic read noise, and good energy resolution have made X-ray Charge-Coupled Devices (CCDs) an obvious choice for developing soft X-ray astronomical instruments over the last half century. They also come in large array formats with small pixel sizes which make them a potential candidate for the next generation astronomical X-ray missions. However, the next generation X-ray telescopic experiments propose for significantly larger collecting area compared to the existing observatories in order to explore the low luminosity and high redshift X-ray universe which requires these detectors to have an order of magnitude faster readout. In this context, the Stanford University (SU) in collaboration with the Massachusetts Institute of Technology (MIT) has initiated the development of fast readout electronics for X-ray CCDs. At SU, we have designed and developed a fast and low noise readout module with the goal of achieving a readout speed of 5 Mpixel/s. We successfully ran a prototype CCD matrix of 512 $\times$ 512 pixels at 4 Mpixels/s. In this paper, we describe the details of the readout electronics and report the performance of the detectors at these readout speeds in terms of read noise and energy resolution. In the future, we plan to continue to improve performance of the readout module and eventually converge to a dedicated ASIC based readout system to enable parallel read out of large array multi-node CCD devices.

preprint2022arXiv

Single electron Sensitive Readout (SiSeRO) X-ray detectors: Technological progress and characterization

Single electron Sensitive Read Out (SiSeRO) is a novel on-chip charge detector output stage for charge-coupled device (CCD) image sensors. Developed at MIT Lincoln Laboratory, this technology uses a p-MOSFET transistor with a depleted internal gate beneath the transistor channel. The transistor source-drain current is modulated by the transfer of charge into the internal gate. At Stanford, we have developed a readout module based on the drain current of the on-chip transistor to characterize the device. Characterization was performed for a number of prototype sensors with different device architectures, e.g. location of the internal gate, MOSFET polysilicon gate structure, and location of the trough in the internal gate with respect to the source and drain of the MOSFET (the trough is introduced to confine the charge in the internal gate). Using a buried-channel SiSeRO, we have achieved a charge/current conversion gain of >700 pA per electron, an equivalent noise charge (ENC) of around 6 electrons root mean square (RMS), and a full width half maximum (FWHM) of approximately 140 eV at 5.9 keV at a readout speed of 625 Kpixel/s. In this paper, we discuss the SiSeRO working principle, the readout module developed at Stanford, and the characterization test results of the SiSeRO prototypes. We also discuss the potential to implement Repetitive Non-Destructive Readout (RNDR) with these devices and the preliminary results which can in principle yield sub-electron ENC performance. Additional measurements and detailed device simulations will be essential to mature the SiSeRO technology. However, this new device class presents an exciting technology for next generation astronomical X-ray telescopes requiring fast, low-noise, radiation hard megapixel imagers with moderate spectroscopic resolution.

preprint2021arXiv

First results on SiSeRO (Single electron Sensitive Read Out) devices -- a new X-ray detector for scientific instrumentation

We present an evaluation of a novel on-chip charge detector, called the Single electron Sensitive Read Out (SiSeRO), for charge-coupled device (CCD) image sensor applications. It uses a p-MOSFET transistor at the output stage with a depleted internal gate beneath the p-MOSFET. Charge transferred to the internal gate modulates the source-drain current of the transistor. We have developed a drain current readout module to characterize the detector. The prototype sensor achieves a charge/current conversion gain of 700 pA per electron, an equivalent noise charge (ENC) of 15 electrons (e-) root mean square (RMS), and a full width half maximum (FWHM) of 230 eV at 5.9 keV. In this paper, we discuss the SiSeRO working principle, the readout module developed at Stanford, and the first characterization test results of the SiSeRO prototypes. While at present only a proof-of-concept experiment, in the near future we plan to use next generation sensors with improved noise performance and an enhanced readout module. In particular, we are developing a readout module enabling Repetitive Non-Destructive Readout (RNDR) of the charge, which can in principle yield sub-electron ENC performance. With these developments, we eventually plan to build a matrix of SiSeRO amplifiers to develop an active pixel sensor with an on-chip ASIC-based readout system. Such a system, with fast readout speeds and sub-electron noise, could be effectively utilized in scientific applications requiring fast and low-noise spectro-imagers.

preprint2008arXiv

Multiple Component Analysis of Time Resolved Spectra of GRB041006: A Clue to the Nature of Underlying Soft Component of GRBs

GRB 041006 was detected by HETE-2 at 12:18:08 UT on 06 October 2004. This GRB displays a soft X-ray emission, a precursor before the onset of the main event, and also a soft X-ray tail after the end of the main peak. The light curves in four different energy bands display different features; At higher energy bands several peaks are seen in the light curve, while at lower energy bands a single broader bump dominates. It is expected that these different features are the result of a mixture of several components each of which has different energetics and variability. To reveal the nature of each component, we analysed the time resolved spectra and they are successfully resolved into several components. We also found that these components can be classified into two distinct classes; One is a component which has an exponential decay of $E_{p}$ with a characteristic timescale shorter than $\sim$ 30 sec, and its spectrum is well represented by a broken power law function, which is frequently observed in many prompt GRB emissions, so it should have an internal-shock origin. Another is a component whose $E_{p}$ is almost unchanged with characteristic timescale longer than $\sim$ 60 sec, and shows a very soft emission and slower variability. The spectrum of the soft component is characterized by either a broken power law or a black body spectrum. This component might originate from a relatively wider and lower velocity jet or a photosphere of the fireball. By assuming that the soft component is a thermal emission, the radiation radius is initially $4.4 \times 10^{6}$ km, which is a typical radius of a blue supergiant, and its expansion velocity is $2.4 \times 10^{5}$ km/s in the source frame.

preprint2008arXiv

New CTI Correction Method for the Spaced-Row Charge Injection of the Suzaku X-Ray Imaging Spectrometer

The charge transfer inefficiency (CTI) of the X-ray CCDs on board the Suzaku satellite (X-ray Imaging Spectrometers; XIS) has increased since the launch due to radiation damage, and the energy resolution has been degraded. To improve the CTI, we have applied a spaced-row charge injection (SCI) technique to the XIS in orbit; by injecting charges into CCD rows periodically, the CTI is actively decreased. The CTI in the SCI mode depends on the distance between a signal charge and a preceding injected row, and the pulse height shows periodic positional variations. Using in-flight data of onboard calibration sources and of the strong iron line from the Perseus cluster of galaxies, we studied the variation in detail. We developed a new method to correct the variation. By applying the new method, the energy resolution (FWHM) at 5.9 keV at March 2008 is ~155 eV for the front-illuminated CCDs and ~175 eV for the back-illuminated CCD.

preprint2007arXiv

HETE-2 Observations of the X-Ray Flash XRF 040916

A long X-ray flash was detected and localized by the instruments aboard the High Energy Transient Explorer II (HETE-2) at 00:03:30 UT on 2004 September 16. The position was reported to the GRB Coordinates Network (GCN) approximately 2 hours after the burst. This burst consists of two peaks separated by 200 s, with durations of 110 s and 60 s. We have analyzed the energy spectra of the 1st and 2nd peaks observed with the Wide Field X-Ray Monitor (WXM) and the French Gamma Telescope (FREGATE). We discuss the origin of the 2nd peak in terms of flux variabilities and timescales. We find that it is most likely part of the prompt emission, and is explained by the long-acting engine model. This feature is similar to some bright X-ray flares detected in the early afterglow phase of bursts observed by the Swift satellite.