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Enrico Rubiola

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physics.ins-det physics.optics physics.data-an astro-ph.IM cond-mat.mes-hall Methodology physics.atom-ph

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preprint2022arXiv

The Statistics of the Cross-Spectrum and the Spectrum Average: Generalization to Multiple Instruments

This article addresses the measurement of the power spectrum of red noise processes at the lowest frequencies, where the minimum acquisition time is so long that it is impossible to average on a sequence of data record. Therefore, averaging is possible only on simultaneous observation of multiple instruments. This is the case of radio astronomy, which we take as the paradigm, but examples may be found in other fields such as climatology and geodesy. We compare the Bayesian confidence interval of the red-noise parameter using two estimators, the spectrum average and the cross-spectrum. While the spectrum average is widely used, the cross-spectrum using multiple instruments is rather uncommon. With two instruments, the cross-spectrum estimator leads to the Variance-Gamma distribution. A generalization to $q$ devices is provided, with the example of the observation of millisecond pulsars with 5 radio telescopes.

preprint2021arXiv

Applying clock comparison methods to pulsar timing observations

Frequency metrology outperforms any other branch of metrology in accuracy (parts in $10^{-16}$) and small fluctuations ($<10^{-17}$). In turn, among celestial bodies, the rotation speed of millisecond pulsars (MSP) is by far the most stable ($<10^{-18}$). Therefore, the precise measurement of the time of arrival (TOA) of pulsar signals is expected to disclose information about cosmological phenomena, and to enlarge our astrophysical knowledge. Related to this topic, Pulsar Timing Array (PTA) projects have been developed and operated for the last decades. The TOAs from a pulsar can be affected by local emission and environmental effects, in the direction of the propagation through the interstellar medium or universally by gravitational waves from super massive black hole binaries. These effects (signals) can manifest as a low-frequency fluctuation over time, phenomenologically similar to a red noise. While the remaining pulsar intrinsic and instrumental background (noise) are white. This article focuses on the frequency metrology of pulsars. From our standpoint, the pulsar is an accurate clock, to be measured simultaneously with several telescopes in order to reject the uncorrelated white noise. We apply the modern statistical methods of time-and-frequency metrology to simulated pulsar data, and we show the detection limit of the correlated red noise signal between telescopes.

preprint2021arXiv

Response and Uncertainty of the Parabolic Variance PVAR to Non-Integer Exponents of the Power Law

Oscillator fluctuations are described as the phase or frequency noise spectrum, or in terms of a wavelet variance as a function of the measurement time. The spectrum is generally approximated by the `power law,' i.e., a Laurent polynomial with integer exponents of the frequency. This article extends the domain of application of PVAR, a wavelet variance which uses the linear regression on phase data to estimate the frequency, and called `parabolic' because such regression is equivalent to a parabolic-shaped weight function applied to frequency fluctuations. In turn, PVAR is relevant in that it improves on the widely-used Modified Allan variance (MVAR) enabling the detection of the same noise processes at the same confidence level in a shorter measurement time. More specifically, we provide (i) the analytical expression of the response of the PVAR to the frequency-noise spectrum in the general case of non-integer exponents of the frequency, and (ii) a useful approximate expression of the statistical uncertainty.

preprint2020arXiv

Artifacts and Errors in Cross-Spectrum Phase Noise Measurements

This article deals with the erratic and inconsistent phase-noise spectra often seen in low-noise oscillators, whose floor is of the order of $-180$ dBc/Hz or less. Such oscillators are generally measured with two-channel instruments based on averaging two simultaneous and statistically independent measures. Our new method consists of inserting a dissipative attenuator between the oscillator under test and the phase-noise analyzer. The thermal noise of the attenuator introduces a controlled amount of phase noise. We compare the phase noise floor to the theoretical expectation with different values of the attenuation in small steps. The analysis reveals a negative bias (underestimation of phase noise) due to the thermal energy of the internal power splitter at the instrument input, and an uncertainty due to crosstalk between the two channels. In not-so-rare unfortunate cases, the bias results in a negative phase-noise spectrum, which is an obvious nonsense. Similar results are observed separately in three labs with instruments from the two major brands. We give experimental evidence, full theory, and suggestions to mitigate the problem. Our multiple-attenuators method provides quantitative information about the correlation phenomena inside the instrument.

preprint2020arXiv

Cross-Spectrum Measurement Statistics

The cross-spectrum method consists in measuring a signal $c(t)$ simultaneously with two independent instruments. Each of these instruments contributes to the global noise by its intrinsec (white) noise, whereas the signal $c(t)$ that we want to characterize could be a (red) noise. We first define the real part of the cross-spectrum as a relevant estimator. Then, we characterize the probability density function (PDF) of this estimator knowing the noise level (direct problem) as a Variance-Gamma (V$Γ$) distribution. Next, we solve the "inverse problem" thanks to Bayes' theorem to obtain an upper limit of the noise level knowing the estimate. Checked by massive Monte Carlo simulations, V$Γ$ proves to be perfectly reliable to any number of degrees of freedom (dof). Finally we compare this method with an other method using the Karhunen-Loève transfrom (KLT). We find an upper limit of the signal level slightly different as the one of V$Γ$ since KLT better takes into account the available informations.

preprint2020arXiv

Influence of flicker noise and nonlinearity on the frequency spectrum of spin torque nano-oscillators

The correlation of phase fluctuations in any type of oscillator fundamentally defines its spectral shape. However, in nonlinear oscillators, such as spin torque nano oscillators, the frequency spectrum can become particularly complex. This is specifically true when not only considering thermal but also colored $1/f$ flicker noise processes, which are crucial in the context of the oscillator's long term stability. In this study, we address the frequency spectrum of spin torque oscillators in the regime of large-amplitude steady oscillations experimentally and as well theoretically. We particularly take both thermal and flicker noise into account. We perform a series of measurements of the phase noise and the spectrum on spin torque vortex oscillators, notably varying the measurement time duration. Furthermore, we develop the modelling of thermal and flicker noise in Thiele equation based simulations. We also derive the complete phase variance in the framework of the nonlinear auto-oscillator theory and deduce the actual frequency spectrum. We investigate its dependence on the measurement time duration and compare with the experimental results. Long term stability is important in several of the recent applicative developments of spin torque oscillators. This study brings some insights on how to better address this issue.

preprint2020arXiv

Phase Sensitivity and Phase Noise of Cantilever-Type Magnetoelastic Sensors Based on the $Δ$E Effect

Magnetoelastic sensors for the detection of low-frequency and low-amplitude magnetic fields are in the focus of research since more than 30 years. In order to minimize the limit of detection (LOD) of such sensor systems, it is of high importance to understand and to be able to quantify the relevant noise sources. In this contribution, cantilever-type electromechanic and magnetoelastic resonators, respectively, are comprehensively investigated and mathematically described not only with regard to their phase sensitivity but especially to the extent of the sensor-intrinsic phase noise. Both measurements and calculations reveal that the fundamental LOD is limited by additive phase noise due to thermal-mechanical noise of the resonator, i.e. by thermally induced random vibrations of the cantilever, and by thermal-electrical noise of the piezoelectric material. However, due to losses in the magnetic material parametric flicker phase noise arises, limiting the overall performance. In particular it is shown that the LOD is virtually independent of the magnetic sensitivity but is solely determined by the magnetic losses. Instead of the sensitivity, the magnetic losses, represented by the material's effective complex permeability, should be considered as the most important parameter for the further improvement of such sensors in the future. This implication is not only valid for magnetoelastic cantilevers but also applies to any type of magnetoelastic resonator.

preprint2019arXiv

Noise Analysis of Open-Loop and Closed-Loop SAW Magnetic Field Sensor Systems

Transmission surface acoustic wave (SAW) sensors are widely used in various fields of application. In order to maximize the limit of detection (LOD) of such sensor systems, it is of high importance to understand and to be able to quantify the relevant noise sources. In this paper, low noise readout systems for the application with a SAW delay line magnetic field sensor in an open-loop and closed-loop configuration are presented and analyzed with regard to their phase noise contribution. By applying oscillator phase noise theory to closed-loop sensor systems, it is shown that the phase noise of the SAW delay line oscillator can be predicted accurately. This allows the derivation of expressions for the limits of detection for both readout structures. Based on these equations, the equivalence between the LOD of open-loop and closed-loop SAW delay line readout can be shown analytically, assuming that the sensor contributes the dominant phase noise. This equality is verified by measurements. These results are applicable to all kinds of phase sensitive delay line sensors.

preprint2019arXiv

Phase-Noise and Amplitude-Noise Measurement of DACs and DDSs

This article proposes a method for the measurement of Phase Noise (PN, or PM noise) and Amplitude Noise (AN, or AM noise) of Digital-to-Analog Converters (DAC) and Direct Digital Synthesizers (DDS) based on modulation-index amplification. The carrier is first reduced by a controlled amount (30-40 dB) by adding a reference signal of nearly equal amplitude and opposite in phase. Then, residual carrier and noise sidebands are amplified and sent to a conventional PN analyzer. The main virtues of our method are: (i) the noise specs of the PN analyzer are relaxed by a factor equal to the carrier suppression ratio; and, (ii) the capability to measure the AN using a PN analyzer, with no need for the analyzer to feature AN measurement. An obvious variant enables AN and PN measurements using an AN analyzer with no PN measurement capability. Such instrument is extremely simple and easy to implement with a power-detector diode followed by a FFT analyzer. Unlike the classical bridge (interferometric) method, there is no need for external line stretcher and variable attenuators because phase and amplitude control is implemented in the device under test. In one case (AD9144), we could measure the noise over 10 decades of frequency. The flicker noise matches the exact $1/f$ law with a maximum discrepancy of $\pm1$ dB over 7.5 decades. Thanks to simplicity, reliability, and low background noise, this method has the potential to become the standard method for the AN and PN measurement of DACs and DDSs.

preprint2016arXiv

Characterization of Zero-Bias Microwave Diode Power Detectors at Cryogenic Temperature

We present the characterization of commercial tunnel diode low-level microwave power detectors at room and cryogenic temperatures. The sensitivity as well as the output voltage noise of the tunnel diodes are measured as functions of the applied microwave power, the signal frequency being 10 GHz. We highlight strong variations of the diode characteristics when the applied microwave power is higher than few microwatt. For a diode operating at ${4}$ K, the differential gain increases from ${1,000}$ V/W to about ${4,500}$ V/W when the power passes from ${-30}$ dBm to ${-20}$ dBm. The diode present a white noise floor equivalent to a NEP of ${0.8}$ pW/ ${\sqrt{\mathrm{Hz}}}$ and ${8}$ pW/${ \sqrt{\mathrm{Hz}}}$ at 4 K and 300 K respectively. Its flicker noise is equivalent to a relative amplitude noise power spectral density ${S_α(1~\mathrm{Hz})=-120}$~dB/Hz at ${4}$ K. Flicker noise is 10 dB higher at room temperature.

preprint2016arXiv

Cross-Spectrum PM Noise Measurements, Thermal Energy and Metamaterial Filters

Virtually all commercial instruments for the measurement of the oscillator PM noise make use of the Cross Spectrum method (arXiv:1004.5539 [physics.ins-det], 2010). High sensitivity is achieved by correlation and averaging on two equal channels which measure the same input, and reject the background of the instrument. We show that a systematic error is always present if the thermal energy of the input power splitter is not accounted for. Such error can result in noise under estimation up to a few dB in the lowest-noise quartz oscillators, and in a complete nonsense in the case of cryogenic oscillators. As another alarming fact, the presence of metamaterial components in the oscillator results in unpredictable behavior and large errors, even in well controlled experimental conditions. We observed a spread of 40 dB in the phase noise spectra of an oscillator, just replacing the output filter.

preprint2016arXiv

Least square estimation of phase, frequency and PDEV

The Omega-preprocessing was introduced to improve phase noise rejection by using a least square algorithm. The associated variance is the PVAR which is more efficient than MVAR to separate the different noise types. However, unlike AVAR and MVAR, the decimation of PVAR estimates for multi-tau analysis is not possible if each counter measurement is a single scalar. This paper gives a decimation rule based on two scalars, the processing blocks, for each measurement. For the Omega-preprocessing, this implies the definition of an output standard as well as hardware requirements for performing high-speed computations of the blocks.

preprint2016arXiv

Phase Noise and Jitter in Digital Electronics

This article explains phase noise, jitter, and some slower phenomena in digital integrated circuits, focusing on high-demanding, noise-critical applications. We introduce the concept of phase type and time type phase noise. The rules for scaling the noise with frequency are chiefly determined by the spectral properties of these two basic types, by the aliasing phenomenon, and by the input and output circuits. Then, we discuss the parameter extraction from experimental data and we report on the measured phase noise in some selected devices of different node size and complexity. We observed flicker noise between -80 and -130 dBrad^2/Hz at 1 Hz offset, and white noise down to -165 dBrad^2/Hz in some fortunate cases and using the appropriate tricks. It turns out that flicker noise is proportional to the reciprocal of the volume of the transistor. This unpleasant conclusion is supported by a gedanken experiment. Further experiments provide understanding on: (i) the interplay between noise sources in the internal PLL, often present in FPGAs; (ii) the chattering phenomenon, which consists in multiple bouncing at transitions; and (iii) thermal time constants, and their effect on phase wander and on the Allan variance.

preprint2015arXiv

Characterization of the individual short-term frequency stability of Cryogenic Sapphire Oscillators at the 1e-16 level

We present the characterisation of three Cryogenic Sapphire Oscillators using the three-corner-hat method. Easily implemented with commercial components and instruments, this method reveals itself very useful to analyse the frequency stability limitations of these state-of-the-art ultra-stable oscillators. The best unit presents a fractional frequency stability better than 5e-16 at 1 s and below 2e-16 for integration times less than 5,000s.

preprint2014arXiv

Influence of the ESR saturation on the power sensitivity of cryogenic sapphire resonators

Here, we study the paramagnetic ions behavior in presence of a strong microwave electromagnetic field sustained inside a cryogenic sapphire whispering gallery mode resonator. The high frequency measurement resolution that can be now achieved by comparing two CSOs permit for the first time to observe clearly the non-linearity of the resonator power sensitivity. These observations that in turn allow us to optimize the CSO operation, are well explained by the Electron Spin Resonance (ESR) saturation of the paramagnetic impurities contained in the sapphire crystal.

preprint2012arXiv

Phase Noise in RF and Microwave Amplifiers

Understanding the amplifier phase noise is a critical issue in numerous fields of engineering and physics, like oscillators, frequency synthesis, telecommunications, radars, spectroscopy, in the emerging domain of microwave photonics, and in more exotic domains like radio astronomy, particle accelerators, etc. This article analyzes the two main types of phase noise in amplifiers, white and flicker. White phase noise results from adding white noise to the RF spectrum around the carrier. For a given amount of RF noise added, noise is proportional to the inverse of the carrier power. By contrast, the 1/f coefficient is a constant parameter of the amplifier, in a wide range of carrier power. This fact has amazing consequences on different amplifier topologies. Connecting m equal amplifiers in parallel, flicker is 1/m times that of one device. Cascading m equal amplifiers, flicker is m times that of one amplifier. Recirculating the signal in an amplifier so that the gain increases by a power of m (a factor of m in dB) due to positive feedback (regeneration), which for integer m is similar to the case of m amplifiers, we find that flicker is m^2 times that of the amplifier alone. Starting from the fact that near-dc flicker exists in all electronic devices, although generally not accessible from outside, the simplest model for the 1/f phase noise is that the near-dc 1/f noise phase-modulates the carrier through some parametric effect in the semiconductor. This model predicts the behavior of the (simple) amplifier and of the different amplifier topologies. Numerous measurements on amplifiers from different technologies and frequencies (HF to microwaves), also including some obsolete amplifiers, validate the theory.

preprint2010arXiv

A generalization of the Leeson effect

The oscillator, inherently, turns the phase noise of its internal components into frequency noise, which results into a multiplication by 1/f^2 in the phase-noise power spectral density. This phenomenon is known as the Leeson effect. This report extends the Leeson effect to the analysis of amplitude noise. This is done by analyzing the slow-varying complex envelope, after freezing the carrier. In the case of amplitude noise, the classical analysis based on the frequency-domain transfer function is possible only after solving and linearizing the complete differential equation that describes the oscillator. The theory predicts that AM noise gives an additional contribution to phase noise. Beside the detailed description of the traditional oscillator, based on the resonator governed by a second-order differential equation (microwave cavity, quartz oscillators etc.), this report is a theoretical framework for the analysis of other oscillators, like for example the masers, lasers, and opto-electronic oscillators. This manuscript is intended as a standalone report, and also as complement to the book E. Rubiola, Phase Noise and Frequency Stability in Oscillators, Cambridge University Press, 2008. ISBN 978-0-521-88677-2 (hardback), 978-0-521-15328-7 (paperback).

preprint2010arXiv

The cross-spectrum experimental method

The noise of a device under test (DUT) is measured simultaneously with two instruments, each of which contributes its own background. The average cross power spectral density converges to the DUT power spectral density. This method enables the extraction of the DUT noise spectrum, even if it is significantly lower than the background. After a snapshot on practical experiments, we go through the statistical theory and the choice of the estimator. A few experimental techniques are described, with reference to phase noise and amplitude noise in RF/microwave systems and in photonic systems. The set of applications of this method is wide. The final section gives a short panorama on radioastronomy, radiometry, quantum optics, thermometry (fundamental and applied), semiconductor technology, metallurgy, etc. This report is intended as a tutorial, as opposed to a report on advanced research, yet addressed to a broad readership: technicians, practitioners, Ph.D. students, academics, and full-time scientists.

preprint2010arXiv

Unprecedented High Long Term Frequency Stability with a Macroscopic Resonator Oscillator

This article reports on the long-term frequency stabilty characterisation of a new type of cryogenic sapphire oscillator using an autonomous pulse-tube cryocooler as its cold source. This new design enables a relative frequency stability of better than 4.5e-15 over one day of integration. This represents to our knowledge the best long-term frequency stability ever obtained with a signal source based on a macroscopic resonator.

preprint2009arXiv

About Quartz Crystal Resonator Noise: Recent Study

The first step, before investigating physical origins of noise in resonators, is to investigate correlations between external measurement parameters and the resonator noise. Tests and measurements are mainly performed on an advanced phase noise measurement system, recently set up. The resonator noise is examined as a function of the sensitivity to the drive level, the temperature operating point and the tuning capacitor.

preprint2008arXiv

Determination of phase noise spectra in optoelectronic microwave oscillators: a Langevin approach

We introduce a stochastic model for the determination of phase noise in optoelectronic oscillators. After a short overview of the main results for the phase diffusion approach in autonomous oscillators, an extension is proposed for the case of optoelectronic oscillators where the microwave is a limit-cycle originated from a bifurcation induced by nonlinearity and time-delay. This Langevin approach based on stochastic calculus is also successfully confronted with experimental measurements.

preprint2005arXiv

Flicker noise in high-speed p-i-n photodiodes

The microwave signal at the output of a photodiode that detects a modulated optical beam contains the phase noise phi(t) and the amplitude noise alpha(t) of the detector. Beside the white noise, which is well understood, the spectral densities S_phi(f) and S_alpha(f) show flicker noise, proportional to 1/f. We report on the measurement of the phase and amplitude noise of high-speed p-i-n photodiodes. The main result is that the flicker coefficient of the samples is approximately 1E-12 rad^2/Hz (-120dB) for phase noise, and approximately 1E-12 Hz^-1 (-120dB) for amplitude noise. These values could be observed only after solving a number of experimental problems and in a protected environment. By contrast, in ordinary conditions insufficient EMI isolation, and also insufficient mechanical isolation, are responsible for additional noise to be taken in. This suggests that if package and EMC are revisited, applications can take the full benefit from the surprisingly low noise of the p-i-n photodiodes.

Enrico Rubiola

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22 published item(s)

The Statistics of the Cross-Spectrum and the Spectrum Average: Generalization to Multiple Instruments

Applying clock comparison methods to pulsar timing observations

Response and Uncertainty of the Parabolic Variance PVAR to Non-Integer Exponents of the Power Law

Artifacts and Errors in Cross-Spectrum Phase Noise Measurements

Cross-Spectrum Measurement Statistics

Influence of flicker noise and nonlinearity on the frequency spectrum of spin torque nano-oscillators

Phase Sensitivity and Phase Noise of Cantilever-Type Magnetoelastic Sensors Based on the $Δ$E Effect

Noise Analysis of Open-Loop and Closed-Loop SAW Magnetic Field Sensor Systems

Phase-Noise and Amplitude-Noise Measurement of DACs and DDSs

Characterization of Zero-Bias Microwave Diode Power Detectors at Cryogenic Temperature

Cross-Spectrum PM Noise Measurements, Thermal Energy and Metamaterial Filters

Least square estimation of phase, frequency and PDEV

Phase Noise and Jitter in Digital Electronics

Characterization of the individual short-term frequency stability of Cryogenic Sapphire Oscillators at the 1e-16 level

Influence of the ESR saturation on the power sensitivity of cryogenic sapphire resonators

Phase Noise in RF and Microwave Amplifiers

A generalization of the Leeson effect

The cross-spectrum experimental method

Unprecedented High Long Term Frequency Stability with a Macroscopic Resonator Oscillator

About Quartz Crystal Resonator Noise: Recent Study

Determination of phase noise spectra in optoelectronic microwave oscillators: a Langevin approach

Flicker noise in high-speed p-i-n photodiodes