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Daniel J. Sorin

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Published work

6 published item(s)

preprint2016arXiv

Profile-Driven Automated Mixed Precision

We present a scheme to automatically set the precision of floating point variables in an application. We design a framework that profiles applications to measure undesirable numerical behavior at the floating point operation level. We use this framework to perform mixed precision analysis to heuristically set the precision of all variables in an application based on their numerical profiles. We experimentally evaluate the mixed precision analysis to show that it can generate a range of results with different accuracy and performance characteristics.

preprint2016arXiv

TREES: A CPU/GPU Task-Parallel Runtime with Explicit Epoch Synchronization

We have developed a task-parallel runtime system, called TREES, that is designed for high performance on CPU/GPU platforms. On platforms with multiple CPUs, Cilk's "work-first" principle underlies how task-parallel applications can achieve performance, but work-first is a poor fit for GPUs. We build upon work-first to create the "work-together" principle that addresses the specific strengths and weaknesses of GPUs. The work-together principle extends work-first by stating that (a) the overhead on the critical path should be paid by the entire system at once and (b) work overheads should be paid co-operatively. We have implemented the TREES runtime in OpenCL, and we experimentally evaluate TREES applications on a CPU/GPU platform.

preprint2015arXiv

Reduced Precision Checking to Detect Errors in Floating Point Arithmetic

In this paper, we use reduced precision checking (RPC) to detect errors in floating point arithmetic. Prior work explored RPC for addition and multiplication. In this work, we extend RPC to a complete floating point unit (FPU), including division and square root, and we present precise analyses of the errors undetectable with RPC that show bounds that are smaller than prior work. We implement RPC for a complete FPU in RTL and experimentally evaluate its error coverage and cost.

preprint2013arXiv

Evaluating Cache Coherent Shared Virtual Memory for Heterogeneous Multicore Chips

The trend in industry is towards heterogeneous multicore processors (HMCs), including chips with CPUs and massively-threaded throughput-oriented processors (MTTOPs) such as GPUs. Although current homogeneous chips tightly couple the cores with cache-coherent shared virtual memory (CCSVM), this is not the communication paradigm used by any current HMC. In this paper, we present a CCSVM design for a CPU/MTTOP chip, as well as an extension of the pthreads programming model, called xthreads, for programming this HMC. Our goal is to evaluate the potential performance benefits of tightly coupling heterogeneous cores with CCSVM.

preprint2013arXiv

Recycled Error Bits: Energy-Efficient Architectural Support for Higher Precision Floating Point

In this work, we provide energy-efficient architectural support for floating point accuracy. Our goal is to provide accuracy that is far greater than that provided by the processor's hardware floating point unit (FPU). Specifically, for each floating point addition performed, we "recycle" that operation's error: the difference between the finite-precision result produced by the hardware and the result that would have been produced by an infinite-precision FPU. We make this error architecturally visible such that it can be used, if desired, by software. Experimental results on physical hardware show that software that exploits architecturally recycled error bits can achieve accuracy comparable to a 2B-bit FPU with performance and energy that are comparable to a B-bit FPU.

preprint2007arXiv

Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown

As device sizes shrink and current densities increase, the probability of device failures due to gate oxide breakdown (OBD) also increases. To provide designs that are tolerant to such failures, we must investigate and understand the manifestations of this physical phenomenon at the circuit and system level. In this paper, we develop a model for operational OBD defects, and we explore how to test for faults due to OBD. For a NAND gate, we derive the necessary input conditions that excite and detect errors due to OBD defects at the gate level. We show that traditional pattern generators fail to exercise all of these defects. Finally, we show that these test patterns can be propagated and justified for a combinational circuit in a manner similar to traditional ATPG.