Researcher profile

Claudio E. Calosso

Claudio E. Calosso contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2020arXiv

Loaded microwave cavity for compact vapor-cell clocks

Vapor-cell devices based on microwave interrogation provide a stable frequency reference with a compact and robust setup. Further miniaturization must focus on optimizing the physics package, containing the microwave cavity and atomic reservoir. In this paper we present a compact cavity-cell assembly based on a dielectric-loaded cylindrical resonator. The structure accommodates a clock cell with $0.9 \, \mathrm{cm^3}$ inner volume and has an outer volume of only $35 \, \mathrm{cm^3}$. The proposed design aims at strongly reducing the core of the atomic clock, maintaining at the same time high-performing short-term stability ($σ_y(τ) \leq 5\times 10^{-13} \,τ^{-1/2}$ standard Allan deviation). The proposed structure is characterized in terms of magnetic field uniformity and atom-field coupling with the aid of finite-elements calculations. The thermal sensitivity is also analyzed and experimentally characterized. We present preliminary spectroscopy results by integrating the compact cavity within a rubidium clock setup based on the pulsed optically pumping technique. The obtained clock signals are compatible with the targeted performances. The loaded-cavity approach is thus a viable design option for miniaturized microwave clocks.

preprint2019arXiv

Phase-Noise and Amplitude-Noise Measurement of DACs and DDSs

This article proposes a method for the measurement of Phase Noise (PN, or PM noise) and Amplitude Noise (AN, or AM noise) of Digital-to-Analog Converters (DAC) and Direct Digital Synthesizers (DDS) based on modulation-index amplification. The carrier is first reduced by a controlled amount (30-40 dB) by adding a reference signal of nearly equal amplitude and opposite in phase. Then, residual carrier and noise sidebands are amplified and sent to a conventional PN analyzer. The main virtues of our method are: (i) the noise specs of the PN analyzer are relaxed by a factor equal to the carrier suppression ratio; and, (ii) the capability to measure the AN using a PN analyzer, with no need for the analyzer to feature AN measurement. An obvious variant enables AN and PN measurements using an AN analyzer with no PN measurement capability. Such instrument is extremely simple and easy to implement with a power-detector diode followed by a FFT analyzer. Unlike the classical bridge (interferometric) method, there is no need for external line stretcher and variable attenuators because phase and amplitude control is implemented in the device under test. In one case (AD9144), we could measure the noise over 10 decades of frequency. The flicker noise matches the exact $1/f$ law with a maximum discrepancy of $\pm1$ dB over 7.5 decades. Thanks to simplicity, reliability, and low background noise, this method has the potential to become the standard method for the AN and PN measurement of DACs and DDSs.