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Claudio E. Calosso

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Published work

5 published item(s)

preprint2020arXiv

Loaded microwave cavity for compact vapor-cell clocks

Vapor-cell devices based on microwave interrogation provide a stable frequency reference with a compact and robust setup. Further miniaturization must focus on optimizing the physics package, containing the microwave cavity and atomic reservoir. In this paper we present a compact cavity-cell assembly based on a dielectric-loaded cylindrical resonator. The structure accommodates a clock cell with $0.9 \, \mathrm{cm^3}$ inner volume and has an outer volume of only $35 \, \mathrm{cm^3}$. The proposed design aims at strongly reducing the core of the atomic clock, maintaining at the same time high-performing short-term stability ($σ_y(τ) \leq 5\times 10^{-13} \,τ^{-1/2}$ standard Allan deviation). The proposed structure is characterized in terms of magnetic field uniformity and atom-field coupling with the aid of finite-elements calculations. The thermal sensitivity is also analyzed and experimentally characterized. We present preliminary spectroscopy results by integrating the compact cavity within a rubidium clock setup based on the pulsed optically pumping technique. The obtained clock signals are compatible with the targeted performances. The loaded-cavity approach is thus a viable design option for miniaturized microwave clocks.

preprint2019arXiv

Phase-Noise and Amplitude-Noise Measurement of DACs and DDSs

This article proposes a method for the measurement of Phase Noise (PN, or PM noise) and Amplitude Noise (AN, or AM noise) of Digital-to-Analog Converters (DAC) and Direct Digital Synthesizers (DDS) based on modulation-index amplification. The carrier is first reduced by a controlled amount (30-40 dB) by adding a reference signal of nearly equal amplitude and opposite in phase. Then, residual carrier and noise sidebands are amplified and sent to a conventional PN analyzer. The main virtues of our method are: (i) the noise specs of the PN analyzer are relaxed by a factor equal to the carrier suppression ratio; and, (ii) the capability to measure the AN using a PN analyzer, with no need for the analyzer to feature AN measurement. An obvious variant enables AN and PN measurements using an AN analyzer with no PN measurement capability. Such instrument is extremely simple and easy to implement with a power-detector diode followed by a FFT analyzer. Unlike the classical bridge (interferometric) method, there is no need for external line stretcher and variable attenuators because phase and amplitude control is implemented in the device under test. In one case (AD9144), we could measure the noise over 10 decades of frequency. The flicker noise matches the exact $1/f$ law with a maximum discrepancy of $\pm1$ dB over 7.5 decades. Thanks to simplicity, reliability, and low background noise, this method has the potential to become the standard method for the AN and PN measurement of DACs and DDSs.

preprint2016arXiv

Phase Noise and Jitter in Digital Electronics

This article explains phase noise, jitter, and some slower phenomena in digital integrated circuits, focusing on high-demanding, noise-critical applications. We introduce the concept of phase type and time type phase noise. The rules for scaling the noise with frequency are chiefly determined by the spectral properties of these two basic types, by the aliasing phenomenon, and by the input and output circuits. Then, we discuss the parameter extraction from experimental data and we report on the measured phase noise in some selected devices of different node size and complexity. We observed flicker noise between -80 and -130 dBrad^2/Hz at 1 Hz offset, and white noise down to -165 dBrad^2/Hz in some fortunate cases and using the appropriate tricks. It turns out that flicker noise is proportional to the reciprocal of the volume of the transistor. This unpleasant conclusion is supported by a gedanken experiment. Further experiments provide understanding on: (i) the interplay between noise sources in the internal PLL, often present in FPGAs; (ii) the chattering phenomenon, which consists in multiple bouncing at transitions; and (iii) thermal time constants, and their effect on phase wander and on the Allan variance.

preprint2015arXiv

Avoiding Aliasing in Allan Variance: an Application to Fiber Link Data Analysis

Optical fiber links are known as the most performing tools to transfer ultrastable frequency reference signals. However, these signals are affected by phase noise up to bandwidths of several kilohertz and a careful data processing strategy is required to properly estimate the uncertainty. This aspect is often overlooked and a number of approaches have been proposed to implicitly deal with it. Here, we face this issue in terms of aliasing and show how typical tools of signal analysis can be adapted to the evaluation of optical fiber links performance. In this way, it is possible to use the Allan variance as estimator of stability and there is no need to introduce other estimators. The general rules we derive can be extended to all optical links. As an example, we apply this method to the experimental data we obtained on a 1284 km coherent optical link for frequency dissemination, which we realized in Italy.

preprint2011arXiv

Planar-Waveguide External Cavity Laser Stabilization for an Optical Link with 1E-19 Frequency Stability

We stabilized the frequency of a compact planar-waveguide external cavity laser (ECL) on a Fabry-Pérot cavity (FPC) through a Pound-Drever-Hall scheme. The residual frequency stability of the ECL is 1E-14, comparable to the stability achievable with a fiber laser (FL) locked to a FPC through the same scheme. We set up an optical link of 100 km, based on fiber spools, that reaches 1E-19 relative stability, and we show that its performances using the ECL or FL are comparable. Thus ECLs could serve as an excellent replacement for FLs in optical links where cost-effectiveness and robustness are important considerations.