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Researcher profile

Christoph Hofer

Christoph Hofer contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
cond-mat.mtrl-sciphysics.app-phcond-mat.mes-hallmath.NAphysics.optics

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Published work

4 published item(s)

preprint2022arXiv

Picometer-precision few-tilt ptychotomography of 2D materials

From ripples to defects, edges and grain boundaries, the 3D atomic structure of 2D materials is critical to their properties. However the damage inflicted by conventional 3D analysis precludes its use with fragile 2D materials, particularly for the analysis of local defects. Here we dramatically increase the potential for precise local 3D atomic structure analysis of 2D materials, with both greatly improved dose efficiency and sensitivity to light elements. We demonstrate light atoms can now be located in complex 2D materials with picometer precision at doses 30 times lower than previously possible. Moreover we demonstrate this using a material, WS$_2$, in which the light S atoms are in fact practically invisible to conventional methods. The key advance is combining the concept of few tilt tomography with highly dose efficient ptychography in scanning transmission electron microscopy. We further demonstrate the method experimentally with the even more challenging and newly discovered 2D CuI, leveraging a new extremely high temporal resolution camera.

0 citations0 reviewsNo code linkedOpen access
preprint2021arXiv

Aligned Stacking of Nanopatterned 2D materials -- Towards 3D printing at atomic resolution

Two-dimensional materials can be combined by placing individual layers on top of each other, so that they are bound only by their van der Waals interaction. The sequence of layers can be chosen arbitrarily, enabling an essentially atomic-level control of the material and thereby a wide choice of properties along one dimension. However, simultaneous control over the structure in the in-plane directions is so far still rather limited. Here, we combine spatially controlled modifications of 2D materials, using focused electron irradiation or electron beam induced etching, with the layer-by-layer assembly of van der Waals heterostructures. A novel assembly process makes it possible to structure each layer with an arbitrary pattern prior to the assembly into the heterostructure. Moreover, it enables a stacking of the layers with accurate lateral alignment, with an accuracy of currently 10nm, under observation in an electron microscope. Together, this enables the fabrication of almost arbitrary 3D structures with highest spatial resolution.

0 citations0 reviewsNo code linkedOpen access
preprint2019arXiv

High-resolution remote thermography using luminescent low-dimensional tin-halide perovskites

While metal-halide perovskites have recently revolutionized research in optoelectronics through a unique combination of performance and synthetic simplicity, their low-dimensional counterparts can further expand the field with hitherto unknown and practically useful optical functionalities. In this context, we present the strong temperature dependence of the photoluminescence (PL) lifetime of low-dimensional, perovskite-like tin-halides, and apply this property to thermal imaging with a high precision of 0.05 °C. The PL lifetimes are governed by the heat-assisted de-trapping of self-trapped excitons, and their values can be varied over several orders of magnitude by adjusting the temperature (up to 20 ns °C-1). Typically, this sensitive range spans up to one hundred centigrade, and it is both compound-specific and shown to be compositionally and structurally tunable from -100 to 110 ° C going from [C(NH2)3]2SnBr4 to Cs4SnBr6 and (C4N2H14I)4SnI6. Finally, through the innovative implementation of cost-effective hardware for fluorescence lifetime imaging (FLI), based on time-of-flight (ToF) technology, these novel thermoluminophores have been used to record thermographic videos with high spatial and thermal resolution.

0 citations0 reviewsNo code linkedOpen access
preprint2018arXiv

A parallel multigrid solver for multi-patch Isogeometric Analysis

Isogeometric Analysis (IgA) is a framework for setting up spline-based discretizations of partial differential equations, which has been introduced around a decade ago and has gained much attention since then. If large spline degrees are considered, one obtains the approximation power of a high-order method, but the number of degrees of freedom behaves like for a low-order method. One important ingredient to use a discretization with large spline degree, is a robust and preferably parallelizable solver. While numerical evidence shows that multigrid solvers with standard smoothers (like Gauss Seidel) does not perform well if the spline degree is increased, the multigrid solvers proposed by the authors and their co-workers proved to behave optimal both in the grid size and the spline degree. In the present paper, the authors want to show that those solvers are parallelizable and that they scale well in a parallel environment.

0 citations0 reviewsNo code linkedOpen access