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Researcher profile

Antonino Miceli

Antonino Miceli contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
physics.ins-detMachine Learningcond-mat.mes-hallcond-mat.mtrl-scicond-mat.supr-conphysics.app-phphysics.optics

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Published work

6 published item(s)

preprint2023arXiv

Demonstration of an AI-driven workflow for autonomous high-resolution scanning microscopy

With the continuing advances in scientific instrumentation, scanning microscopes are now able to image physical systems with up to sub-atomic-level spatial resolutions and sub-picosecond time resolutions. Commensurately, they are generating ever-increasing volumes of data, storing and analysis of which is becoming an increasingly difficult prospect. One approach to address this challenge is through self-driving experimentation techniques that can actively analyze the data being collected and use this information to make on-the-fly measurement choices, such that the data collected is sparse but representative of the sample and sufficiently informative. Here, we report the Fast Autonomous Scanning Toolkit (FAST) that combines a trained neural network, a route optimization technique, and efficient hardware control methods to enable a self-driving scanning microscopy experiment. The key features of our method are that: it does not require any prior information about the sample, it has a very low computational cost, and that it uses generic hardware controls with minimal experiment-specific wrapping. We test this toolkit in numerical experiments and a scanning dark-field x-ray microscopy experiment of a $WSe_2$ thin film, where our experiments show that a FAST scan of <25% of the sample is sufficient to produce both a high-fidelity image and a quantitative analysis of the surface distortions in the sample. We show that FAST can autonomously identify all features of interest in the sample while significantly reducing the scan time, the volume of data acquired, and dose on the sample. The FAST toolkit is easy to apply for any scanning microscopy modalities and we anticipate adoption of this technique will empower broader multi-level studies of the evolution of physical phenomena with respect to time, temperature, or other experimental parameters.

0 citations0 reviewsNo code linkedOpen access
preprint2023arXiv

Full-Field Nanoscale X-ray Diffraction-Contrast Imaging using Direct Detection

Recent developments in x-ray science provide methods to probe deeply embedded mesoscale grain structures and spatially resolve them using dark field x-ray microscopy (DFXM). Extending this technique to investigate weak diffraction signals such as magnetic systems, quantum materials and thin films proves challenging due to available detection methods and incident x-ray flux at the sample. We present a direct detection method focusing on DFXM studies in the hard x-ray range of 10s of keV and above capable of approaching nanoscale resolution. Additionally, we compare this direct detection scheme with routinely used scintillator based optical detection and achieve an order of magnitude improvement in exposure times allowing for imaging of weakly diffracting ordered systems.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

Bridging Data Center AI Systems with Edge Computing for Actionable Information Retrieval

Extremely high data rates at modern synchrotron and X-ray free-electron laser light source beamlines motivate the use of machine learning methods for data reduction, feature detection, and other purposes. Regardless of the application, the basic concept is the same: data collected in early stages of an experiment, data from past similar experiments, and/or data simulated for the upcoming experiment are used to train machine learning models that, in effect, learn specific characteristics of those data; these models are then used to process subsequent data more efficiently than would general-purpose models that lack knowledge of the specific dataset or data class. Thus, a key challenge is to be able to train models with sufficient rapidity that they can be deployed and used within useful timescales. We describe here how specialized data center AI (DCAI) systems can be used for this purpose through a geographically distributed workflow. Experiments show that although there are data movement cost and service overhead to use remote DCAI systems for DNN training, the turnaround time is still less than 1/30 of using a locally deploy-able GPU.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

fairDMS: Rapid Model Training by Data and Model Reuse

Extracting actionable information rapidly from data produced by instruments such as the Linac Coherent Light Source (LCLS-II) and Advanced Photon Source Upgrade (APS-U) is becoming ever more challenging due to high (up to TB/s) data rates. Conventional physics-based information retrieval methods are hard-pressed to detect interesting events fast enough to enable timely focusing on a rare event or correction of an error. Machine learning~(ML) methods that learn cheap surrogate classifiers present a promising alternative, but can fail catastrophically when changes in instrument or sample result in degradation in ML performance. To overcome such difficulties, we present a new data storage and ML model training architecture designed to organize large volumes of data and models so that when model degradation is detected, prior models and/or data can be queried rapidly and a more suitable model retrieved and fine-tuned for new conditions. We show that our approach can achieve up to 100x data labelling speedup compared to the current state-of-the-art, 200x improvement in training speed, and 92x speedup in-terms of end-to-end model updating time.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

Pushing compute and AI onto detector silicon

In order to take full advantage of the U.S. Department of Energy&#39;s billion-dollar investments into the next-generation research infrastructure (e.g., exascale, light sources, colliders), advances are required not only in detector technology but also in computing and specifically AI. Let us consider an example from X-ray science. Nanoscale X-ray imaging is a crucial tool to enable a wide range of scientific explorations from materials science and biology to mechanical and civil engineering. The next-generation light sources will increase the X-ray beam brightness and coherent flux by 100 to 1,000 times. In order to image larger samples, the continuous frame rate of pixel array detectors must be increased, approaching 1 MHz, which requires several Tbps (aggregated) to transfer pixel data out to a data acquisition system. Using 65-nm CMOS technology, an optimistic raw data rate off such a chip is about 100-200 Gbps. However, a continuous 1 MHz detector with only $256 \times 256$ pixels at 16-bit resolution, for example, will require 1,000 Gbps (i.e., 1 Tbps) bandwidth off the chip! It is impractical to have multiple high-speed transceivers running in parallel to provide such bandwidth and represents the first data bottleneck. New approaches are necessary to reduce the data size by performing data compression or AI-based feature extraction directly inside a detector silicon chip in a streaming manner before sending it off-chip.

0 citations0 reviewsNo code linkedOpen access
preprint2019arXiv

Hard X-ray Fluorescence measurements with TESs at the Advanced Photon Source

Transition Edge Sensor (TES) spectrometers for hard X-ray beamline science will enable improved X-ray emission and absorption spectroscopy in the information-rich 2 to 20 keV energy range. We are building a TES-based instrument for the Advanced Photon Source (APS) synchrotron, to be made available to beamline users. 24-pixel prototype arrays have recently been fabricated and tested. The first spectroscopy measurements using these arrays are promising, with a best single-pixel energy resolution of 11.2 eV and saturation energy > 20 keV. We present a series of recent X-ray Fluorescence measurements involving transition metal elements and multi-element samples with closely spaced emission lines, in particular a Cu-Ni-Co thin film and a foil of Cu and Hf. The TES-measured spectra are directly compared to spectra measured with silicon drift detectors at an APS beamline, demonstrating the improved X-ray science made possible by TES spectrometers.

0 citations0 reviewsNo code linkedOpen access