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Andrew J. Lohn

Andrew J. Lohn appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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Published work

3 published item(s)

preprint2022arXiv

Empirical Evaluation of Physical Adversarial Patch Attacks Against Overhead Object Detection Models

Adversarial patches are images designed to fool otherwise well-performing neural network-based computer vision models. Although these attacks were initially conceived of and studied digitally, in that the raw pixel values of the image were perturbed, recent work has demonstrated that these attacks can successfully transfer to the physical world. This can be accomplished by printing out the patch and adding it into scenes of newly captured images or video footage. In this work we further test the efficacy of adversarial patch attacks in the physical world under more challenging conditions. We consider object detection models trained on overhead imagery acquired through aerial or satellite cameras, and we test physical adversarial patches inserted into scenes of a desert environment. Our main finding is that it is far more difficult to successfully implement the adversarial patch attacks under these conditions than in the previously considered conditions. This has important implications for AI safety as the real-world threat posed by adversarial examples may be overstated.

preprint2020arXiv

Estimating the Brittleness of AI: Safety Integrity Levels and the Need for Testing Out-Of-Distribution Performance

Test, Evaluation, Verification, and Validation (TEVV) for Artificial Intelligence (AI) is a challenge that threatens to limit the economic and societal rewards that AI researchers have devoted themselves to producing. A central task of TEVV for AI is estimating brittleness, where brittleness implies that the system functions well within some bounds and poorly outside of those bounds. This paper argues that neither of those criteria are certain of Deep Neural Networks. First, highly touted AI successes (eg. image classification and speech recognition) are orders of magnitude more failure-prone than are typically certified in critical systems even within design bounds (perfectly in-distribution sampling). Second, performance falls off only gradually as inputs become further Out-Of-Distribution (OOD). Enhanced emphasis is needed on designing systems that are resilient despite failure-prone AI components as well as on evaluating and improving OOD performance in order to get AI to where it can clear the challenging hurdles of TEVV and certification.

preprint2014arXiv

Degenerate Resistive Switching and Ultrahigh Density Storage in Resistive Memory

We show that, in tantalum oxide resistive memories, activation power provides a multi-level variable for information storage that can be set and read separately from the resistance. These two state variables (resistance and activation power) can be precisely controlled in two steps: (1) the possible activation power states are selected by partially reducing resistance, then (2) a subsequent partial increase in resistance specifies the resistance state and the final activation power state. We show that these states can be precisely written and read electrically, making this approach potentially amenable for ultra-high density memories. We provide a theoretical explanation for information storage and retrieval from activation power and experimentally demonstrate information storage in a third dimension related to the change in activation power with resistance.