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A. Kakanakova-Georgieva

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3 publications

preprint2022arXiv

Discovering atomistic pathways for supply of metal atoms to graphene surface from methyl-based precursors

Conceptual 2D group III nitrides and oxides (e.g., 2D InN and 2D InO) in heterostructures with graphene have been realized by metalorganic chemical vapor deposition (MOCVD). MOCVD is credited with being central to fabrication of established semiconductor materials and by purpose for an advance in emergent semiconductor materials at the 2D limit. A defining characteristic of MOCVD is the employment of metalorganic precursors such as trimethyl-indium, -gallium, and -aluminum, which contain (strong) metal-carbon bonds. Mechanisms that regulate MOCVD processes at the atomic scale are largely unknown. Here, we employ density-functional molecular dynamics -- accounting for van der Waals interactions -- to locate reaction pathways responsible for dissociation of trimethylindium (TMIn) precursor in the gas phase as well as on top-layer and zero-layer graphene. The simulations reveal how collisions with hydrogen molecules, intramolecular or surface-mediated proton transfer, and direct TMIn/graphene reactions assist TMIn transformations, which ultimately enables delivery of In monomers, or InH and CH3In admolecules, on graphene. Results presented also show how TMIn/H2 reactions on graphene, or in the gas phase, lead to formation of methane, ethane, propane, ethene hydrocarbons, and atomic hydrogen. This work provides knowledge for understanding thin-film nucleation and intercalation mechanisms at the atomic scale and for overcoming challenges in integration of 2D materials and graphene heterostructures in technology.

preprint2015arXiv

Infrared dielectric function, phonon modes and free-charge carrier properties of high-Al-content Alx_xGa1−x_{1-x}N alloys determined by mid-infrared spectroscopic ellipsometry and optical Hall effect

The phonon mode parameters and anisotropic mid-infrared dielectric function tensor components of high- Al-content Alx_xGa1−x_{1-x}N alloys in dependence of the Al content xx are precisely determined from mid-infrared spectroscopic ellipsometry measurements for a set of high-quality Si-doped Alx_xGa1−x_{1-x}N epitaxial layers on 4H-SiC substrates. Two-mode behavior of the E1E_1(TO) modes and one-mode behavior of the A1A_1(LO) mode are found in agreement with previous Raman scattering spectroscopy reports. The composition dependencies of the IR active phonon frequency parameters are established and a discussion on the silent B1B_1 mode that may be disorder activated is provided. The static dielectric constants in dependence of xx are determined by using the best-match model derived phonon mode frequency and high-frequency dielectric constant parameters and applying the Lydanne-Sachs-Teller relation. The effective mass parameter in high-Al-content Alx_xGa1−x_{1-x}N alloys and its composition dependence are determined from mid-infrared optical Hall effect measurements. Furtheremore, the free electron concentration NN and mobility parameters μμ of Alx_xGa1−x_{1-x}N films with similar Si doping levels are investigated as function of the Al content, xx and discussed.

preprint2013arXiv

Electron effective mass in Al0.72_{0.72}Ga0.28_{0.28}N alloys determined by mid-infrared optical Hall effect

The effective electron mass parameter in Si-doped Al0.72_{0.72}Ga0.28_{0.28}N is determined to be m∗=(0.336±0.020) m0m^\ast=(0.336\pm0.020)\,m_0 from mid-infrared optical Hall effect measurements. No significant anisotropy of the effective electron mass parameter is found supporting theoretical predictions. Assuming a linear change of the effective electron mass with the Al content in AlGaN alloys and m∗=0.232 m0m^\ast=0.232\,m_0 for GaN, an average effective electron mass of m∗=0.376 m0m^\ast=0.376\,m_0 can be extrapolated for AlN. The analysis of mid-infrared spectroscopic ellipsometry measurements further confirms the two phonon mode behavior of the E1_1(TO) and one phonon mode behavior of the A1_1(LO) phonon mode in high-Al-content AlGaN alloys as seen in previous Raman scattering studies.

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