Abstract
Several sources of noise limit the sensitivity of current gravitational wave detectors. Currently, dominant noise sources include quantum noise and thermal Brownian noise, but future detectors will also be limited by other thermal noise channels. In this paper we study a thermal noise source which is caused by spatial charge carrier density variations in semiconductor materials. We provide an analytical model for the understanding of charge carrier fluctuations under the presence of screening effects and show that charge carrier noise will not be a limiting noise source for third generation gravitational wave detectors.
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