Abstract

X-ray powder diffraction and electrical resistivity measurements were performed on the tetragonal compound CeCoSi under pressure to elucidate the phase boundary of the pressure-induced structural transition and the change in the 4ff electronic state. The temperature-pressure phase diagram has been determined from the shift of the Bragg peaks and from the anomaly in the resistivity. The critical pressure, PsP_{\rm s} ∼\sim 4.9 GPa at 300 K, decreases to PsP_{\rm s} ∼\sim 3.6 GPa at 10 K. The decrease of PsP_{\rm s} is due not only to the decrease in volume of the unit cell but also to an anisotropic shrinkage by cooling. When crossing the boundary to the high-pressure phase, the resistivity shows a significant drop to exhibit a metallic temperature dependence. The results of this study strongly suggest that the structural phase transition can be ascribed to valence instability of Ce-4f4f electron.

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