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Measurement of the shot noise in a single electron transistor

We have systematically measured the shot noise in a single electron transistor (SET) as a function of bias and gate voltages. By embedding a SET in a resonance circuit we have been able to measure its shot noise at the resonance frequency 464 MHz, where the 1/f noise is negligible. We can extract the Fano factor which varies between 0.5 and 1 depending on the amount of Coulomb blockade in the SET, in very good agreement with the theory.

preprint2008arXivOpen access
Sergey KafanovPer Delsing
cond-mat.mes-hallcond-mat.str-el
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Sergey KafanovPer Delsing

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