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Measurement of the coupling between applied stress and magnetism in a manganite thin film

We measured the magnetization depth profile of a (La1-xPrx)1-yCayMnO3 (x = 0.60\pm0.04, y = 0.20\pm0.03) film as a function of applied bending stress using polarized neutron reflectometry. From these measurements we obtained a coupling coefficient relating strain to the depth dependent magnetization. We found application of compressive (tensile) bending stress along the magnetic easy axis increases (decreases) the magnetization of the film.

preprint2012arXivOpen access
Surendra SinghM. R. FitzsimmonsT. LookmanH. JeenA. BiswasM. A. RoldanM. Varela
cond-mat.str-elcond-mat.mtrl-sci
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Open access7 authors2 topics
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Surendra SinghM. R. FitzsimmonsT. LookmanH. JeenA. BiswasM. A. RoldanM. Varela

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