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Measurement Of Quasiparticle Transport In Aluminum Films Using Tungsten Transition-Edge Sensors

We report new experimental studies to understand the physics of phonon sensors which utilize quasiparticle diffusion in thin aluminum films into tungsten transition-edge-sensors (TESs) operated at 35 mK. We show that basic TES physics and a simple physical model of the overlap region between the W and Al films in our devices enables us to accurately reproduce the experimentally observed pulse shapes from x-rays absorbed in the Al films. We further estimate quasiparticle loss in Al films using a simple diffusion equation approach.

preprint2014arXivOpen access
J. J. YenB. ShankB. A. YoungB. CabreraP. L. BrinkM. CherryJ. M KreikebaumR. MoffattP. RedlA. TomadaE. C. Tortorici
physics.ins-det
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Open access11 authors1 topic
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J. J. YenB. ShankB. A. YoungB. CabreraP. L. BrinkM. CherryJ. M KreikebaumR. MoffattP. RedlA. TomadaE. C. Tortorici

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