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Gate-controlled proximity magnetoresistance in In1-xGaxAs/(Ga,Fe)Sb bilayer heterostructures

The magnetic proximity effect (MPE), ferromagnetic coupling at the interface of magnetically dissimilar layers, attracts much attention as a promising pathway for introducing ferromagnetism into a high-mobility non-magnetic conducting channel. Recently, our group found giant proximity magnetoresistance (PMR), which is caused by MPE at an interface between a non-magnetic semiconductor InAs quantum well (QW) layer and a ferromagnetic semiconductor (Ga,Fe)Sb layer. The MPE in the non-magnetic semiconductor can be modulated by applying a gate voltage and controlling the penetration of the electron wavefunction in the InAs QW into the neighboring insulating ferromagnetic (Ga,Fe)Sb layer. However, optimal conditions to obtain strong MPE at the InAs/(Ga,Fe)Sb interface have not been clarified. In this paper, we systematically investigate the PMR properties of In1-xGaxAs (x = 0%, 5%, 7.5%, and 10%) / (Ga,Fe)Sb bilayer semiconductor heterostructures under a wide range of gate voltage. The inclusion of Ga alters the electronic structures of the InAs thin film, in particular changing the effective mass and the QW potential of electron carriers. Our experimental results and theoretical analysis of the PMR in these In1-xGaxAs/(Ga,Fe)Sb heterostructures show that the MPE depends not only on the degree of penetration of the electron wavefunction into (Ga,Fe)Sb but also on the electron density. These findings help us to unveil the microscopic mechanism of MPE in semiconductor-based non-magnetic/ferromagnetic heterojunctions.