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Exploring properties of the integrating pixels

This paper presents some observations and ideas collected during the tests of the SOI sensors, based on the integration type pixels. First, it contains a rough analysis of the Correlated Double Sampling filtering properties with respect to different noise sources and long sampling intervals, which are typical for the pixels under consideration. Second, results of the pixel leakage current measurements in the pix_2012 and DIPIX pixel detector chips are presented.

preprint2015arXivOpen access
Piotr Julian KapustaYasuo AraiSzymon BugielRoma DasguptaSebastian GlabMarek IdzikWojciech KucewiczToshinobu MiyoshiMichal Turala
hep-exphysics.ins-det
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Open access9 authors2 topics
Imported metadata coverageMissing code, dataset, citation and institution fields are tracked without dominating the paper.Details
Citations: 0Reviews: 0Saves: 0Code: not linkedDataset: not linkedInstitutions: 0

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Piotr Julian KapustaYasuo AraiSzymon BugielRoma DasguptaSebastian GlabMarek IdzikWojciech KucewiczToshinobu MiyoshiMichal Turala

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