Abstract
We report a gradual suppression of the two-dimensional electron gas (2DEG) at the LaAlO3/SrTiO3 interface on substitution of chromium at the Al sites. The sheet carrier density at the interface (ns) drops monotonically from 2.2x10(14) cm-2 to 2.5x10(13) cm-2 on replacing nearly 60 percent of Al sites by Cr and the sheet resistance (Rs) exceeds the quantum limit for localization (h/2e2) in the concentrating range 40 to 60 percent of Cr.
Connections
Explore this paper’s authors, topics and related work.
Building this map preview
BZPEER is loading the nearby papers, people, topics and institutions for this page.
Reviews 0
Write a review
No reviews yet.
Discussion 0
Add a comment
No comments yet.