Abstract
A room temperature operating Vertical External Cavity Surface Emitting Laser is applied around 1550 nm to intracavity laser absorption spectroscopy analyzed by time-resolved Fourier transform interferometry. At an equivalent pathlength of 15 km, the high resolution spectrum of the semiconductor disk laser emission covers 17 nm simultaneously. A noise equivalent absorption coefficient at one second averaging equal to 1.5 10^{-10} cm^{-1}.Hz^{-1/2} per spectral element is reported for the 65 km longest path length employed.
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