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Zubair Al Azim

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Published work

9 published item(s)

preprint2015arXiv

Modeling and Simulation of Spin Transfer Torque Generated at Topological Insulator/Ferromagnetic Heterostructure

Topological Insulator (TI) has recently emerged as an attractive candidate for possible application to spintronic circuits because of its strong spin orbit coupling. TIs are unique materials that have an insulating bulk but conducting surface states due to band inversion and these surface states are protected by time reversal symmetry. In this paper, we propose a physics-based spin dynamics simulation framework for TI/Ferromagnet (TI/FM) bilayer heterostructures that is able to capture the electronic band structure of a TI while calculating the electron and spin transport properties. Our model differs from TI/FM models proposed in the literature in that it is able to account for the 3D band structure of TIs and the effect of exchange coupling and external magnetic field on the band structure. Our proposed approach uses 2D surface Hamiltonian for TIs that includes all necessary features for spin transport calculations so as to properly model the characteristics of a TI/FM heterostructure. Using this Hamiltonian and appropriate parameters, we show that the effect of quantum confinement and exchange coupling are successfully captured in the calculated surface band structure compared with the quantum well band diagram of a 3D TI, and matches well with experimental data reported in the literature. We then show how this calibrated Hamiltonian is used with the self-consistent non equilibrium Green's functions (NEGF) formalism to determine the charge and spin transport in TI/FM bilayer heterostructures. Our calculations agree well with experimental data and capture the unique features of a TI/FM heterostructure such as high spin Hall angle, high spin conductivity etc. Finally, we show how the results obtained from NEGF calculations may be incorporated into the Landau-Lifshitz-Gilbert-Slonczewski (LLGS) formulation to simulate the magnetization dynamics of an FM layer sitting on top of a TI.

preprint2015arXiv

Spin-Torque Sensors for Energy Efficient High Speed Long Interconnects

In this paper, we propose a Spin-Torque (ST) based sensing scheme that can enable energy efficient multi-bit long distance interconnect architectures. Current-mode interconnects have recently been proposed to overcome the performance degradations associated with conventional voltage mode Copper (Cu) interconnects. However, the performance of current mode interconnects are limited by analog current sensing transceivers and equalization circuits. As a solution, we propose the use of ST based receivers that use Magnetic Tunnel Junctions (MTJ) and simple digital components for current-to-voltage conversion and do not require analog transceivers. We incorporate Spin-Hall Metal (SHM) in our design to achieve high speed sensing. We show both single and multi-bit operations that reveal major benefits at higher speeds. Our simulation results show that the proposed technique consumes only 3.93-4.72 fJ/bit/mm energy while operating at 1-2 Gbits/sec; which is considerably better than existing charge based interconnects. In addition, Voltage Controlled Magnetic Anisotropy (VCMA) can reduce the required current at the sensor. With the inclusion of VCMA, the energy consumption can be further reduced to 2.02-4.02 fJ/bit/mm

preprint2014arXiv

A Physically Based Analytical Model to Predict Quantized Eigen Energies and Wave Functions Incorporating Penetration Effect

We propose a physically based analytical compact model to calculate Eigen energies and Wave functions which incorporates penetration effect. The model is applicable for a quantum well structure that frequently appears in modern nano-scale devices. This model is equally applicable for both silicon and III-V devices. Unlike other models already available in the literature, our model can accurately predict all the eigen energies without the inclusion of any fitting parameters. The validity of our model has been checked with numerical simulations and the results show significantly better agreement compared to the available methods.

preprint2014arXiv

Laser Induced Magnetization Reversal for Detection in Optical Interconnects

Optical interconnect has emerged as the front-runner to replace electrical interconnect especially for off-chip communication. However, a major drawback with optical interconnects is the need for photodetectors and amplifiers at the receiver, implemented usually by direct bandgap semiconductors and analog CMOS circuits, leading to large energy consumption and slow operating time. In this article, we propose a new optical interconnect architecture that uses a magnetic tunnel junction (MTJ) at the receiver side that is switched by femtosecond laser pulses. The state of the MTJ can be sensed using simple digital CMOS latches, resulting in significant improvement in energy consumption. Moreover, magnetization in the MTJ can be switched on the picoseconds time-scale and our design can operate at a speed of 5 Gbits/sec for a single link.

preprint2014arXiv

Spin-Orbit Torque Induced Spike-Timing Dependent Plasticity

Nanoelectronic devices that mimic the functionality of synapses are a crucial requirement for performing cortical simulations of the brain. In this work we propose a ferromagnet-heavy metal heterostructure that employs spin-orbit torque to implement Spike-Timing Dependent Plasticity. The proposed device offers the advantage of decoupled spike transmission and programming current paths, thereby leading to reliable operation during online learning. Possible arrangement of such devices in a crosspoint architecture can pave the way for ultra-dense neural networks. Simulation studies indicate that the device has the potential of achieving pico-Joule level energy consumption (maximum 2 pJ per synaptic event) which is comparable to the energy consumption for synaptic events in biological synapses.

preprint2012arXiv

A Physically Based Analytical Modeling of Threshold Voltage Control for Fully-Depleted SOI Double Gate NMOS-PMOS Flexible-FET

In this work, we propose an explicit analytical equation to show the variation of top gate threshold voltage with respect to the JFET bottom gate voltage for a Flexible Threshold Voltage Field Effect Transistor (Flexible-FET) by solving 2-D Poisson's equation with appropriate boundary conditions, incorporating Young's parabolic approximation. The proposed model illustrates excellent match with the experimental results for both n-channel and p-channel 180nm Flexible-FETs. Threshold voltage variation with several important device parameters (oxide and silicon channel thickness, doping concentration) is observed which yields qualitative matching with results obtained from SILVACO simulations.

preprint2012arXiv

In_xGa_{1-x}Sb MOSFET: Performance Analysis by Self Consistent CV Characterization and Direct Tunneling Gate Leakage Current

In this paper, Capacitance-Voltage (C-V) characteristics and direct tunneling (DT) gate leakage current of antimonide based surface channel MOSFET were investigated. Self-consistent method was applied by solving coupled Schrödinger-Poisson equation taking wave function penetration and strain effects into account. Experimental I-V and gate leakage characteristic for p-channel InxGa1-xSb MOSFETs are available in recent literature. However, a self- consistent simulation of C-V characterization and direct tunneling gate leakage current is yet to be done for both n- channel and p-channel InxGa1-xSb surface channel MOSFETs. We studied the variation of C-V characteristics and gate leakage current with some important process parameters like oxide thickness, channel composition, channel thickness and temperature for n-channel MOSFET in this work. Device performance should improve as compressive strain increases in channel. Our simulation results validate this phenomenon as ballistic current increases and gate leakage current decreases with the increase in compressive strain. We also compared the device performance by replacing InxGa1-xSb with InxGa1-xAs in channel of the structure. Simulation results show that performance is much better with this replacement.

preprint2012arXiv

Self Consistent Simulation of C-V Characterization and Ballistic Performance of Double Gate SOI Flexible-FET Incorporating QM Effects

Capacitance-Voltage (C-V) & Ballistic Current- Voltage (I-V) characteristics of Double Gate (DG) Silicon-on- Insulator (SOI) Flexible FETs having sub 35nm dimensions are obtained by self-consistent method using coupled Schrodinger- Poisson solver taking into account the quantum mechanical effects. Although, ATLAS simulations to determine current and other short channel effects in this device have been demonstrated in recent literature, C-V & Ballistic I-V characterizations by using self-consistent method are yet to be reported. C-V characteristic of this device is investigated here with the variation of bottom gate voltage. The depletion to accumulation transition point (i.e. Threshold voltage) of the C-V curve should shift in the positive direction when the bottom gate is negatively biased and our simulation results validate this phenomenon. Ballistic performance of this device has also been studied with the variation of top gate voltage.

preprint2012arXiv

Self-Consistent C-V Characterization of Depletion Mode Buried Channel InGaAs/InAs Quantum Well FET Incorporating Strain Effects

We investigated Capacitance-Voltage (C-V) characteristics of the Depletion Mode Buried Channel InGaAs/InAs Quantum Well FET by using Self-Consistent method incorporating Quantum Mechanical (QM) effects. Though the experimental results of C-V for enhancement type device is available in recent literature, a complete characterization of electrostatic property of depletion type Buried Channel Quantum Well FET (QWFET) structure is yet to be done. C-V characteristics of the device is studied with the variation of three important process parameters: Indium (In) composition, gate dielectric and oxide thickness. We observed that inversion capacitance and ballistic current tend to increase with the increase in Indium (In) content in InGaAs barrier layer.