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Yiyang Huang

Yiyang Huang appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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Published work

3 published item(s)

preprint2022arXiv

Invertible Mask Network for Face Privacy-Preserving

Face privacy-preserving is one of the hotspots that arises dramatic interests of research. However, the existing face privacy-preserving methods aim at causing the missing of semantic information of face and cannot preserve the reusability of original facial information. To achieve the naturalness of the processed face and the recoverability of the original protected face, this paper proposes face privacy-preserving method based on Invertible "Mask" Network (IMN). In IMN, we introduce a Mask-net to generate "Mask" face firstly. Then, put the "Mask" face onto the protected face and generate the masked face, in which the masked face is indistinguishable from "Mask" face. Finally, "Mask" face can be put off from the masked face and obtain the recovered face to the authorized users, in which the recovered face is visually indistinguishable from the protected face. The experimental results show that the proposed method can not only effectively protect the privacy of the protected face, but also almost perfectly recover the protected face from the masked face.

preprint2020arXiv

A novel direct structured-light inspection technique for contaminant and defect detection

The Direct Structured-Light Inspection Technique (DSIT) proposed in this paper is a novel method that can be implemented under two types of binary structured light illumination to detect contaminants and defects on specular surfaces and transparent objects, in which light reflection system is used to detect specular surfaces, while light transmission system is applied for transparent object inspection. Based on this technique, contaminant and defect distribution can be directly obtained without any calculation process. Relevant simulations and experiments are performed to prove the effectiveness of DSIT.

preprint2020arXiv

Improved mathematical models of structured-light modulation analysis technique for contaminant and defect detection

Surface quality inspection of optical components is critical in optical and electronic industries. Structured-Light Modulation Analysis Technique (SMAT) is a novel method recently proposed for the contaminant and defect detection of specular surfaces and transparent objects, and this approach was verified to be effective in eliminating ambient light. The mechanisms and mathematical models of SMAT were analyzed and established based on the theory of photometry and the optical characteristics of contaminants and defects. However, there are still some phenomena exist as conundrums in actual detection process, which cannot be well explained. In order to better analyze the phenomena in practical circumstances, improved mathematical models of SMAT are constructed based on the surface topography of contaminants and defects in this paper. These mathematical models can be used as tools for analyzing various contaminants and defects in different systems, and provide effective instruction for subsequent work. Simulations and experiments on the modulation and the luminous flux of fringe patterns have been implemented to verify the validity of these mathematical models. In adddition, by using the fringe patterns with mutually perpendicular sinusoidal directions, two obtained modulation images can be merged to solve the incomplete information acquisition issue caused by the differentiated response of modulation.