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Xiaona Yan

Xiaona Yan contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2022arXiv

Temperature-driven Emergence of Negative Photoconductivity in Semimetal MoTe2 Film Probed with Terahertz Spectroscopy

Layered two-dimensional (2D) materials MoTe2 have been paid special attention due to the rich optoelectronic properties with various phases. The nonequilibrium carrier dynamics as well as its temperature dependence in MoTe2 are of prime importance, as it can shed light on understanding the anomalous optical response and potential applications in far infrared (IR) photodetection. Hereby, we employ time-resolved terahertz (THz) spectroscopy to study the temperature dependent nonequilibrium carrier dynamics in MoTe2 films. After photoexcitation of 1.59 eV, the 1T'-phase MoTe2 at high temperature behaves only THz positive photoconductivity (PPC) with relaxation time of less than 1 ps. In contrast, the Td-phase MoTe2 at low temperature shows ultrafast THz PPC initially followed by emerging THz negative photoconductivity (NPC), and the THz NPC signal relaxes to the equilibrium state in hundreds of ps time scale. Small polaron formation induced by hot carrier has been proposed to be ascribed to the THz NPC in the polar semimetal MoTe2 at low temperature. The polaron formation time after photoexcitation increases slightly with temperature, which is determined to be ~0.4 ps at 5 K and 0.5 ps at 100 K. Our experimental result demonstrates for the first time the dynamical formation of small poalron in MoTe2 Weyl semimetal, this is fundamental importance on the understanding the temperature dependent electron-phonon coupling and quantum phase transition, as well as the designing the MoTe2-based far IR photodetector.

preprint2022arXiv

Ultrafast Dynamics of Defect-Assisted Auger process in PdSe2 films: Synergistic Interaction Between Defect Trapping and Auger Effect

Strong Coulomb interactions in two-dimensional systems, together with quantum confinement, make many-body processes particularly effective for carrier dynamics, which plays a crucial role in determining carrier lifetime, photoconductivity, and emission yield of the materials. Hereby, by using optical pump and terahertz probe spectroscopy, we have investigated the photocarrier dynamics in the PdSe2 films with different thickness. The experimental results reveal that the photocarrier relaxation consists of two components: a fast component of 2.5 ps that shows the layer-thickness independence, and a slow component has typical lifetime of 7.3 ps decreasing with the layer thickness. Surprisingly, the relaxation times for both fast and slow components are exhibited both pump fluence and temperature independence, which suggests that synergistic interactions between defect trapping and Auger effect dominate the photocarrier dynamics in PdSe2 films. A model involving defect-assisted Auger process is proposed, which can reproduce the experimental results well. The fitting results reveal that the layer dependent lifetime is determined by the defect density rather than carrier occupancy rate after photoexcitation. Our results underscore the interplay between Auger process and defects in two-dimensional semiconductors.