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Researcher profile

Vincent Favre-Nicolin

Vincent Favre-Nicolin contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
cond-mat.mtrl-sciphysics.optics

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Published work

5 published item(s)

preprint2022arXiv

darfix: Data analysis for dark-field X-ray microscopy

A Python package for the analysis of dark-field X-ray microscopy (DFXM) and rocking curve imaging (RCI) data is presented. \textit{darfix} provides a set of data processing and visualization tools that can be either imported as library components or accessed through a graphical user interface (GUI) as an Orange add-on. In the latter case, the different analysis modules can be easily chained to define computational workflows. Operations on larger-than-memory image sets are supported through the implementation of online versions of the data processing algorithms, effectively trading performance for feasibility when the computing resources are limited. The software can automatically extract the relevant instrument angle settings from the input files metadata. The currently available input file format is EDF and in future releases HDF5 will be incorporated.

0 citations0 reviewsNo code linkedOpen access
preprint2019arXiv

Free log-likelihood as an unbiased metric for coherent diffraction imaging

Coherent Diffraction Imaging (CDI), a technique where an object is reconstructed from a single (2D or 3D) diffraction pattern, recovers the lost diffraction phases without a priori knowledge of the extent (support) of the object, which prevents an unambiguous metric evaluation of solutions. We propose to use a 'free' log-likelihood indicator, where a small percentage of points are masked from the reconstruction algorithms, as an unbiased metric to evaluate the validity of proposed solutions, independent of the sample studied. We also show how a set of solutions can be analysed through an eigen-decomposition to yield a better estimate of the real object. Example analysis on experimental data is presented both for a test pattern dataset, and the diffraction pattern from a live cyanobacteria cell. The method allows the validation of reconstructions on a wide range of materials (hard condensed, biological,..), and should be particularly relevant for 4th generation synchrotrons and X-ray free electron lasers, where large, high-throughput datasets require a method for unsupervised data evaluation.

0 citations0 reviewsNo code linkedOpen access
preprint2013arXiv

Time-dependent relaxation of strained silicon-on-insulator lines using a partially coherent x-ray nanobeam

We report on the quantitative determination of the strain map in a strained Silicon-On-Insulator (sSOI) line with a 200x70 nm^2 cross-section. In order to study a single line as a function of time, we used an X-ray nanobeam with relaxed coherence properties as a compromise between beam size, coherence and intensity. We demonstrate how it is possible to reconstruct the line deformation at the nanoscale, and follow its evolution as the line relaxes under the influence of the X-ray nanobeam.

0 citations0 reviewsNo code linkedOpen access
preprint2012arXiv

Interface-driven phase separation in multifunctional materials: the case of GeMn ferromagnetic semiconductor

We use extensive first principle simulations to show the major role played by interfaces in the mechanism of phase separation observed in semiconductor multifunctional materials. We make an analogy with the precipitation sequence observed in over-saturated AlCu alloys, and replace the Guinier-Preston zones in this new context. A new class of materials, the $α$ phases, is proposed to understand the formation of the coherent precipitates observed in the GeMn system. The interplay between formation and interface energies is analyzed for these phases and for the structures usually considered in the literature. The existence of the alpha phases is assessed with both theoretical and experimental arguments.

0 citations0 reviewsNo code linkedOpen access
preprint2011arXiv

Fast computing of scattering maps of nanostructures using graphical processing units

Scattering maps from strained or disordered nano-structures around a Bragg reflection can either be computed quickly using approximations and a (Fast) Fourier transform, or using individual atomic positions. In this article we show that it is possible to compute up to 4.10^10 $reflections.atoms/s using a single graphic card, and we evaluate how this speed depends on number of atoms and points in reciprocal space. An open-source software library (PyNX) allowing easy scattering computations (including grazing incidence conditions) in the Python language is described, with examples of scattering from non-ideal nanostructures.

0 citations0 reviewsNo code linkedOpen access